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contributor authorK. J. Zwick
contributor authorI. M. Cohen
contributor authorP. S. Ayyaswamy
date accessioned2017-05-08T23:46:54Z
date available2017-05-08T23:46:54Z
date copyrightSeptember, 1995
date issued1995
identifier issn1528-9044
identifier otherJEPAE4-26150#215_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/115144
description abstractA curing oven that is commonly used in microelectronic manufacturing has been analyzed to determine the causes of contamination of parts passing through the oven, and to eliminate this contamination. During the curing of microelectronic chip packages, a volatile component contained in the bonding epoxy is released as a vapor. This vapor is usually removed (scavenged) by blowing a process gas through jets. However, some condensation of this vapor may (and often does) occur on the chips, contaminating them and rendering them functionally useless. It is desirable to completely eliminate this condensation. This paper presents a flow visualization study of the complicated flow patterns within the oven created by the jet-flows. Vortices are produced due to jet interactions. These vortices inhibit scavenging (entrainment and removal) of the contaminant vapor and are undesirable. A new design that eliminates the vortices and enhances the scavenging is described. In Part II of this study, a numerical simulation of the process is described.
publisherThe American Society of Mechanical Engineers (ASME)
titleJet-Flow Scavenging of a Curing Oven—Part I: Flow Visualization
typeJournal Paper
journal volume117
journal issue3
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2792094
journal fristpage215
journal lastpage219
identifier eissn1043-7398
keywordsFlow visualization
keywordsJets
keywordsCuring
keywordsOvens
keywordsVapors
keywordsVortices
keywordsFlow (Dynamics)
keywordsCondensation
keywordsContamination
keywordsDesign
keywordsComputer simulation
keywordsManufacturing
keywordsBonding
keywordsEpoxy adhesives AND Rendering
treeJournal of Electronic Packaging:;1995:;volume( 117 ):;issue: 003
contenttypeFulltext


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