Show simple item record

contributor authorR. G. Bayer
date accessioned2017-05-08T23:43:58Z
date available2017-05-08T23:43:58Z
date copyrightMarch, 1994
date issued1994
identifier issn1528-9044
identifier otherJEPAE4-26141#16_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/113455
description abstractA model for thermal fatigue that accounts for both plastic and elastic strains and a mean strain is developed. The model is based on a combination of the generalized Coffin-Manson Equation and the Goodman diagram for fatigue. This model was applied to two accelerated thermal cycling tests—one was for TAB leads; the other, unfilled PTHs at TCM sites in PC boards. Good agreement between the model and data was found. In addition, an existing industry model, which is based solely on plastic strain, is compared to the proposed model and the observed behavior in these two tests. It was concluded that both the effects of elastic and plastic strains and a mean strain are needed to explain the results of these evaluations.
publisherThe American Society of Mechanical Engineers (ASME)
titleA New Model for Accelerated Thermal Cycle Testing With Application to TAB Leads and PCB PTHs
typeJournal Paper
journal volume116
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2905487
journal fristpage16
journal lastpage22
identifier eissn1043-7398
keywordsFatigue
keywordsLumber
keywordsTesting
keywordsCycles AND Equations
treeJournal of Electronic Packaging:;1994:;volume( 116 ):;issue: 001
contenttypeFulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record