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    Tribology of Ion Bombarded Silicon for Micromechanical Applications

    Source: Journal of Tribology:;1993:;volume( 115 ):;issue: 003::page 392
    Author:
    B. K. Gupta
    ,
    Bharat Bhushan
    ,
    Jacques Chevallier
    DOI: 10.1115/1.2921649
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Silicon is used in the fabrication of microelectromechanical systems (MEMS). The friction and wear characteristics are of major design concern for any mechanical device requiring relative motion. In the present investigations we have studied the influence of ion bombardment on the microstructure, crystallinity, composition, microhardness, friction, and wear behavior. The ion bombardment modifies the elastic/plastic deformation characteristics and crack nucleation that occurs during the indentation. C+ bombarded monocrystalline and polycrystalline Si exhibit very low coefficient of friction (0.025–0.05) and wear factors (10−7 mm3 /N m) while slid against 52100 steel and alumina in dry and moist air and dry nitrogen atmospheres. Ion bombardment resulted in the formation of an amorphized layer that consists of SiC, C, and Si. We have shown that the improvements in friction and wear are because of the formation of SiC and not because of amorphization alone.
    keyword(s): Tribology , Silicon , Friction , Wear , Microelectromechanical systems , Fracture (Materials) , Design , Microhardness , Nitrogen , Steel , Motion , Manufacturing , Nucleation (Physics) AND Deformation ,
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      Tribology of Ion Bombarded Silicon for Micromechanical Applications

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/112659
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    contributor authorB. K. Gupta
    contributor authorBharat Bhushan
    contributor authorJacques Chevallier
    date accessioned2017-05-08T23:42:35Z
    date available2017-05-08T23:42:35Z
    date copyrightJuly, 1993
    date issued1993
    identifier issn0742-4787
    identifier otherJOTRE9-28504#392_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/112659
    description abstractSilicon is used in the fabrication of microelectromechanical systems (MEMS). The friction and wear characteristics are of major design concern for any mechanical device requiring relative motion. In the present investigations we have studied the influence of ion bombardment on the microstructure, crystallinity, composition, microhardness, friction, and wear behavior. The ion bombardment modifies the elastic/plastic deformation characteristics and crack nucleation that occurs during the indentation. C+ bombarded monocrystalline and polycrystalline Si exhibit very low coefficient of friction (0.025–0.05) and wear factors (10−7 mm3 /N m) while slid against 52100 steel and alumina in dry and moist air and dry nitrogen atmospheres. Ion bombardment resulted in the formation of an amorphized layer that consists of SiC, C, and Si. We have shown that the improvements in friction and wear are because of the formation of SiC and not because of amorphization alone.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleTribology of Ion Bombarded Silicon for Micromechanical Applications
    typeJournal Paper
    journal volume115
    journal issue3
    journal titleJournal of Tribology
    identifier doi10.1115/1.2921649
    journal fristpage392
    journal lastpage399
    identifier eissn1528-8897
    keywordsTribology
    keywordsSilicon
    keywordsFriction
    keywordsWear
    keywordsMicroelectromechanical systems
    keywordsFracture (Materials)
    keywordsDesign
    keywordsMicrohardness
    keywordsNitrogen
    keywordsSteel
    keywordsMotion
    keywordsManufacturing
    keywordsNucleation (Physics) AND Deformation
    treeJournal of Tribology:;1993:;volume( 115 ):;issue: 003
    contenttypeFulltext
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