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contributor authorB. K. Gupta
contributor authorBharat Bhushan
contributor authorJacques Chevallier
date accessioned2017-05-08T23:42:35Z
date available2017-05-08T23:42:35Z
date copyrightJuly, 1993
date issued1993
identifier issn0742-4787
identifier otherJOTRE9-28504#392_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/112659
description abstractSilicon is used in the fabrication of microelectromechanical systems (MEMS). The friction and wear characteristics are of major design concern for any mechanical device requiring relative motion. In the present investigations we have studied the influence of ion bombardment on the microstructure, crystallinity, composition, microhardness, friction, and wear behavior. The ion bombardment modifies the elastic/plastic deformation characteristics and crack nucleation that occurs during the indentation. C+ bombarded monocrystalline and polycrystalline Si exhibit very low coefficient of friction (0.025–0.05) and wear factors (10−7 mm3 /N m) while slid against 52100 steel and alumina in dry and moist air and dry nitrogen atmospheres. Ion bombardment resulted in the formation of an amorphized layer that consists of SiC, C, and Si. We have shown that the improvements in friction and wear are because of the formation of SiC and not because of amorphization alone.
publisherThe American Society of Mechanical Engineers (ASME)
titleTribology of Ion Bombarded Silicon for Micromechanical Applications
typeJournal Paper
journal volume115
journal issue3
journal titleJournal of Tribology
identifier doi10.1115/1.2921649
journal fristpage392
journal lastpage399
identifier eissn1528-8897
keywordsTribology
keywordsSilicon
keywordsFriction
keywordsWear
keywordsMicroelectromechanical systems
keywordsFracture (Materials)
keywordsDesign
keywordsMicrohardness
keywordsNitrogen
keywordsSteel
keywordsMotion
keywordsManufacturing
keywordsNucleation (Physics) AND Deformation
treeJournal of Tribology:;1993:;volume( 115 ):;issue: 003
contenttypeFulltext


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