Show simple item record

contributor authorYi-Hsin Pao
contributor authorRatan Govila
contributor authorScott Badgley
contributor authorEdward Jih
date accessioned2017-05-08T23:41:03Z
date available2017-05-08T23:41:03Z
date copyrightMarch, 1993
date issued1993
identifier issn1528-9044
identifier otherJEPAE4-26135#1_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/111783
description abstractA solder joint specimen has been designed to determine the stress/strain hysteresis response and fracture behavior of 90 percent wtPb/10 percent wtSn solder alloy. The specimen consists of an Al2 O3 beam and an Al 2024-T4 beam bonded together at the ends with solder. The specimen is subjected to thermal cycling to failure between 40°C to 140°C with a 10°C/min ramp rate and 10-minute hold times. Stress/strain hysteresis loops were experimentally determined as a function of thermal cycles. A method based on the stress relaxation data at hold times has been developed to determine the steady state creep parameters of the solder. A constitutive equation for the solder alloy based on elastic and creep deformation has been formulated and implemented in a finite element code, ABAQUS. Good agreement was obtained between the finite element model and the experimental results. In the thermal fatigue test, crack length versus number of thermal cycles was measured for two different shear strain ranges, and the fracture surface was examined with SEM. The SEM results show a combined transgranular and intergranular fracture. In addition, a significant amount of secondary cracks and voids were generated during thermal fatigue which led to material weakening. A thermal fatigue model based on the C* integral, the measured stress history, and creep properties was employed to model the fracture behavior.
publisherThe American Society of Mechanical Engineers (ASME)
titleAn Experimental and Finite Element Study of Thermal Fatigue Fracture of PbSn Solder Joints
typeJournal Paper
journal volume115
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2909296
journal fristpage1
journal lastpage8
identifier eissn1043-7398
keywordsFatigue
keywordsFinite element analysis
keywordsFracture (Process)
keywordsSolder joints
keywordsStress
keywordsSolders
keywordsCreep
keywordsAlloys
keywordsCycles
keywordsEquations
keywordsFailure
keywordsFatigue testing
keywordsFinite element model
keywordsRelaxation (Physics)
keywordsShear (Mechanics) AND Steady state
treeJournal of Electronic Packaging:;1993:;volume( 115 ):;issue: 001
contenttypeFulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record