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contributor authorA. Mertol
date accessioned2017-05-08T23:40:58Z
date available2017-05-08T23:40:58Z
date copyrightDecember, 1993
date issued1993
identifier issn1528-9044
identifier otherJEPAE4-26140#440_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/111744
description abstractA three-dimensional finite element model of a multichip module (MCM) has been developed by using ANSYS™ finite element simulation code. The model has been used for thermal characterization of the module. In addition, optimum dimensions of an external heat sink, which maintains the specified device’s junction temperature within desired operating temperature limits, are determined as functions of air flow rate and power density of surrounding semiconductor devices. Parametric studies have been performed to study the effects of heat sink height, width and length on junction-to-ambient thermal resistance of a high power application specific integrated circuit (ASIC) device found in the MCM assembly. A set of curves are generated to select either heat sink dimensions or air speed for a given design requirements. Influence of the power output of surrounding devices on the thermal performance of the high power ASIC device is also assessed. The predicted results indicate that the ASIC device’s junction temperature as well as junction-to-ambient resistance increase as the power of the surrounding packages increases. This effect diminishes if a sufficiently large heat sink is used to cool the package.
publisherThe American Society of Mechanical Engineers (ASME)
titleOptimization of Extruded Type External Heat Sink for Multichip Module
typeJournal Paper
journal volume115
journal issue4
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2909354
journal fristpage440
journal lastpage444
identifier eissn1043-7398
keywordsOptimization
keywordsHeat sinks
keywordsMulti-chip modules
keywordsJunctions
keywordsTemperature
keywordsDimensions
keywordsManufacturing
keywordsAir flow
keywordsElectrical resistance
keywordsSimulation
keywordsDesign
keywordsFinite element analysis
keywordsSemiconductors (Materials)
keywordsFinite element model
keywordsFunctions
keywordsThermal resistance
keywordsOperating temperature
keywordsIntegrated circuits
keywordsThermal characterization AND Density
treeJournal of Electronic Packaging:;1993:;volume( 115 ):;issue: 004
contenttypeFulltext


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