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    Surface Modification and Measurement Using a Scanning Tunneling Microscope With a Diamond Tip

    Source: Journal of Tribology:;1992:;volume( 114 ):;issue: 003::page 493
    Author:
    D. B. Bogy
    DOI: 10.1115/1.2920910
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Scanning Tunneling Microscopy is used to modify and measure the surface of magnetic media disks. A very rugged diamond tip allows continued scanning after it has severely scratched or punched the surface. Three techniques are used. First a manual method of penetrating the surface using a stand-alone head makes a scratch of essentially uncontrollable length and depth. Then the normal head is used to cause surface penetration by removing the bias voltage while scanning. Better control is obtained as regards the location and depth of the indentation. Excellent control of indentation location and depth can be obtained by using a new software developed by the STM manufacturer to push the tip into the surface with the piezoelectric scanner. The control of the indentations and their subsequent measurement may make the STM a useful tool as a hardness tester for ultra-thin films, on the order of a few tens of nanometers.
    keyword(s): Scanning tunneling microscopy , Diamonds , Electric potential , Hardness testers , Disks AND Computer software ,
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      Surface Modification and Measurement Using a Scanning Tunneling Microscope With a Diamond Tip

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    http://yetl.yabesh.ir/yetl1/handle/yetl/110920
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    contributor authorD. B. Bogy
    date accessioned2017-05-08T23:39:40Z
    date available2017-05-08T23:39:40Z
    date copyrightJuly, 1992
    date issued1992
    identifier issn0742-4787
    identifier otherJOTRE9-28497#493_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/110920
    description abstractScanning Tunneling Microscopy is used to modify and measure the surface of magnetic media disks. A very rugged diamond tip allows continued scanning after it has severely scratched or punched the surface. Three techniques are used. First a manual method of penetrating the surface using a stand-alone head makes a scratch of essentially uncontrollable length and depth. Then the normal head is used to cause surface penetration by removing the bias voltage while scanning. Better control is obtained as regards the location and depth of the indentation. Excellent control of indentation location and depth can be obtained by using a new software developed by the STM manufacturer to push the tip into the surface with the piezoelectric scanner. The control of the indentations and their subsequent measurement may make the STM a useful tool as a hardness tester for ultra-thin films, on the order of a few tens of nanometers.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleSurface Modification and Measurement Using a Scanning Tunneling Microscope With a Diamond Tip
    typeJournal Paper
    journal volume114
    journal issue3
    journal titleJournal of Tribology
    identifier doi10.1115/1.2920910
    journal fristpage493
    journal lastpage498
    identifier eissn1528-8897
    keywordsScanning tunneling microscopy
    keywordsDiamonds
    keywordsElectric potential
    keywordsHardness testers
    keywordsDisks AND Computer software
    treeJournal of Tribology:;1992:;volume( 114 ):;issue: 003
    contenttypeFulltext
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian