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contributor authorD. B. Bogy
date accessioned2017-05-08T23:39:40Z
date available2017-05-08T23:39:40Z
date copyrightJuly, 1992
date issued1992
identifier issn0742-4787
identifier otherJOTRE9-28497#493_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/110920
description abstractScanning Tunneling Microscopy is used to modify and measure the surface of magnetic media disks. A very rugged diamond tip allows continued scanning after it has severely scratched or punched the surface. Three techniques are used. First a manual method of penetrating the surface using a stand-alone head makes a scratch of essentially uncontrollable length and depth. Then the normal head is used to cause surface penetration by removing the bias voltage while scanning. Better control is obtained as regards the location and depth of the indentation. Excellent control of indentation location and depth can be obtained by using a new software developed by the STM manufacturer to push the tip into the surface with the piezoelectric scanner. The control of the indentations and their subsequent measurement may make the STM a useful tool as a hardness tester for ultra-thin films, on the order of a few tens of nanometers.
publisherThe American Society of Mechanical Engineers (ASME)
titleSurface Modification and Measurement Using a Scanning Tunneling Microscope With a Diamond Tip
typeJournal Paper
journal volume114
journal issue3
journal titleJournal of Tribology
identifier doi10.1115/1.2920910
journal fristpage493
journal lastpage498
identifier eissn1528-8897
keywordsScanning tunneling microscopy
keywordsDiamonds
keywordsElectric potential
keywordsHardness testers
keywordsDisks AND Computer software
treeJournal of Tribology:;1992:;volume( 114 ):;issue: 003
contenttypeFulltext


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