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contributor authorM. D. Osterman
date accessioned2017-05-08T23:38:06Z
date available2017-05-08T23:38:06Z
date copyrightSeptember, 1992
date issued1992
identifier issn1528-9044
identifier otherJEPAE4-26132#305_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/110047
description abstractTraditionally, placement techniques have focused on improving rotability based on minimizing the total wire length between interconnected components. However, electronic card assembly (ECA) reliability, which is measured in terms of time to failure, cycles to failure, or the hazard rates of the individual components, the interconnections, and the PWB, is also affected by component placement. This paper discusses component placement for reliability based on a failure model which incorporates component temperature, a base operating temperature, a threshold temperature, and change in temperature. Placement procedures are developed so as to minimize the time to failure or the total hazard rate of the components on a PWB utilizing a forced convection cooling.
publisherThe American Society of Mechanical Engineers (ASME)
titleA Physics of Failure Approach to Component Placement
typeJournal Paper
journal volume114
journal issue3
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2905455
journal fristpage305
journal lastpage309
identifier eissn1043-7398
keywordsPhysics
keywordsFailure
keywordsTemperature
keywordsReliability
keywordsPrinted circuit boards
keywordsOperating temperature
keywordsWire
keywordsForced convection
keywordsCycles
keywordsCooling AND Manufacturing
treeJournal of Electronic Packaging:;1992:;volume( 114 ):;issue: 003
contenttypeFulltext


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