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contributor authorA. Zubelewicz
contributor authorQ. Guo
contributor authorE. C. Cutiongco
contributor authorM. E. Fine
contributor authorL. M. Keer
date accessioned2017-05-08T23:32:25Z
date available2017-05-08T23:32:25Z
date copyrightJune, 1990
date issued1990
identifier issn1528-9044
identifier otherJEPAE4-26116#179_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/106790
description abstractFatigue lifetimes of low-tin high-lead and tin-lead eutectic solders under total strain controlled tension-tension tests were studied in this paper. Based on the stress and strain micro-macro correlations, a modified Coffin-Manson law is obtained. The modified lifetime prediction formulas which had been used to predict the fatigue lifetime for low-tin high-lead solder, exhibiting cyclic hardening and then saturation, was found to apply to the eutectic solder, where substantial cyclic softening has been observed. This micromechanically based approach allows one to model the known physical phenomena in solders by modifying the appropriate parameters in the predictive micromechanically based constitutive equations.
publisherThe American Society of Mechanical Engineers (ASME)
titleMicromechanical Method to Predict Fatigue Life of Solder
typeJournal Paper
journal volume112
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2904360
journal fristpage179
journal lastpage182
identifier eissn1043-7398
keywordsSolders
keywordsFatigue life
keywordsFatigue
keywordsTension
keywordsFormulas
keywordsStress
keywordsHardening AND Constitutive equations
treeJournal of Electronic Packaging:;1990:;volume( 112 ):;issue: 002
contenttypeFulltext


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