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contributor authorR. A. Konetzki
contributor authorM. X. Zhang
contributor authorD. A. Sluzewski
contributor authorY. A. Chang
date accessioned2017-05-08T23:32:25Z
date available2017-05-08T23:32:25Z
date copyrightJune, 1990
date issued1990
identifier issn1528-9044
identifier otherJEPAE4-26116#175_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/106788
description abstractThe oxidation of (Pb,Sn) and (Pb,In) single-phase alloys and the Pb-Sn eutectic was studied using Auger electron spectroscopy (AES) and a scanning Auger microprobe (SAM). The oxidation of the single-phase alloys results in a structure which has been called “an oxide inversion layer”, where the amount of solute in the oxide increases with depth into the oxide layer, reaches a maximum, then decreases to its value in the bulk alloy. The solute content of the oxide is noticeably higher in the region surrounding grain boundaries, due to the enhanced diffusion of the solute. Grain boundary oxidation is also observed in the single-phase alloys. The oxidation kinetics of both the single-phase (Pb,Sn) alloys and the eutectic alloy are logarithmic at 22° C and 90° C, but become parabolic at temperatures greater than 120° C. Pb-3.0 at. percent In alloys follow logarithmic oxidation kinetics up to 150°C and parabolic kinetics between 175°C and 250°C.
publisherThe American Society of Mechanical Engineers (ASME)
titleOxidation of (Pb, Sn) and (Pb, In) Alloys
typeJournal Paper
journal volume112
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2904359
journal fristpage175
journal lastpage178
identifier eissn1043-7398
keywordsAlloys
keywordsoxidation
keywordsGrain boundaries
keywordsAugers
keywordsElectron spectroscopy
keywordsEutectic alloys
keywordsIndium alloys
keywordsTemperature AND Diffusion (Physics)
treeJournal of Electronic Packaging:;1990:;volume( 112 ):;issue: 002
contenttypeFulltext


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