| contributor author | T. S. E. Summers | |
| contributor author | J. W. Morris | |
| date accessioned | 2017-05-08T23:32:24Z | |
| date available | 2017-05-08T23:32:24Z | |
| date copyright | June, 1990 | |
| date issued | 1990 | |
| identifier issn | 1528-9044 | |
| identifier other | JEPAE4-26116#94_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/106775 | |
| description abstract | Isothermal fatigue data were collected for the compositions 5Sn-95Pb, 20Sn-80Pb, 40Sn-60Pb, 50Sn-50Pb and 63Sn-37Pb within the binary Sn-Pb system. All of these compositions are commercially available and include those most commonly used. Because Sn-rich solders are rarely used, they were not investigated here. The fatigue life was defined by a 30 percent load drop. The solders were tested in a double shear configuration joined to copper at 75° C. The displacement rate chosen was 0.01 mm/min, which corresponds to a strain rate of 1.5 × 10−4 s−1 for our specimen configuration, over a 10 percent plastic strain range. Additionally, the microstructural changes during fatigue are presented. The various solder compositions studied exhibit strikingly different as-solidified microstructures. These differences are discussed in terms of their effect on the isothermal joint failure mechanism and joint isothermal fatigue life. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Isothermal Fatigue Behavior of Sn-Pb Solder Joints | |
| type | Journal Paper | |
| journal volume | 112 | |
| journal issue | 2 | |
| journal title | Journal of Electronic Packaging | |
| identifier doi | 10.1115/1.2904364 | |
| journal fristpage | 94 | |
| journal lastpage | 99 | |
| identifier eissn | 1043-7398 | |
| keywords | Fatigue | |
| keywords | Solder joints | |
| keywords | Solders | |
| keywords | Fatigue life | |
| keywords | Copper | |
| keywords | Stress | |
| keywords | Drops | |
| keywords | Shear (Mechanics) | |
| keywords | Failure mechanisms AND Displacement | |
| tree | Journal of Electronic Packaging:;1990:;volume( 112 ):;issue: 002 | |
| contenttype | Fulltext | |