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contributor authorR. Magnusson
contributor authorA. Haji-Sheikh
contributor authorA. Hafiz
contributor authorJ. S. Bagby
date accessioned2017-05-08T23:32:23Z
date available2017-05-08T23:32:23Z
date copyrightSeptember, 1990
date issued1990
identifier issn1528-9044
identifier otherJEPAE4-26117#255_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/106768
description abstractDouble-exposure holographic interferometry with crystals of iron-doped lithium niobate as the storage material is applied to study heat transfer from electronic chips. These crystals are self-developing, making the reults immediately available for use. This method of interferometry can be used to study the temperature field in heating and cooling fluids. In particular, it is a practical method for studying the heat transfer from small devices such as microelectronic chips. Double-exposure holographic interferometry is a viable experimental technique in transient as well as steady-state problems.
publisherThe American Society of Mechanical Engineers (ASME)
titleHolographic Interferometry Using Self-Developing Optical Crystals for Heat Flux Evaluation
typeJournal Paper
journal volume112
journal issue3
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2904375
journal fristpage255
journal lastpage259
identifier eissn1043-7398
keywordsCrystals
keywordsHolographic interferometry
keywordsHeat flux
keywordsHeat transfer
keywordsTemperature
keywordsFluids
keywordsInterferometry
keywordsHeating and cooling
keywordsIron
keywordsLithium
keywordsSteady state AND Storage
treeJournal of Electronic Packaging:;1990:;volume( 112 ):;issue: 003
contenttypeFulltext


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