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    Techniques to Predict Dislocation Generation During Growth of Silicon Ribbon

    Source: Journal of Engineering Materials and Technology:;1987:;volume( 109 ):;issue: 003::page 209
    Author:
    C. T. Tsai
    ,
    R. J. De Angelis
    ,
    O. W. Dillon
    DOI: 10.1115/1.3225965
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper describes the numerical techniques that are used to predict stresses, strains, dislocation densities, and buckling during the growth of flat plate silicon. High quality silicon ribbon would be an ideal starting material for manufacturing solar cells for electrical power generation. The techniques developed are uniquely related to the material model that is used which is a generalization of the silicon model reported by Hassen in Germany, Sumino in Japan and their co-workers. The novelty of the model is that it accounts for a changing dislocation density and through this, the plastic strain rate also changes with the dislocation density. The rate of dislocation generation depends on the stresses, temperature as well as the existing dislocation density. The numerical techniques that are discussed incorporate this novel material model in the analysis of the silicon ribbon growing process. This approach requires that the stresses and dislocation density due to a complex thermal field be determined. The details of these techniques are the main feature of this paper.
    keyword(s): Dislocations , Silicon , Dislocation density , Stress , Buckling , Temperature , Manufacturing , Solar cells , Electric power generation AND Flat plates ,
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      Techniques to Predict Dislocation Generation During Growth of Silicon Ribbon

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    http://yetl.yabesh.ir/yetl1/handle/yetl/102508
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    contributor authorC. T. Tsai
    contributor authorR. J. De Angelis
    contributor authorO. W. Dillon
    date accessioned2017-05-08T23:24:50Z
    date available2017-05-08T23:24:50Z
    date copyrightJuly, 1987
    date issued1987
    identifier issn0094-4289
    identifier otherJEMTA8-26917#209_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/102508
    description abstractThis paper describes the numerical techniques that are used to predict stresses, strains, dislocation densities, and buckling during the growth of flat plate silicon. High quality silicon ribbon would be an ideal starting material for manufacturing solar cells for electrical power generation. The techniques developed are uniquely related to the material model that is used which is a generalization of the silicon model reported by Hassen in Germany, Sumino in Japan and their co-workers. The novelty of the model is that it accounts for a changing dislocation density and through this, the plastic strain rate also changes with the dislocation density. The rate of dislocation generation depends on the stresses, temperature as well as the existing dislocation density. The numerical techniques that are discussed incorporate this novel material model in the analysis of the silicon ribbon growing process. This approach requires that the stresses and dislocation density due to a complex thermal field be determined. The details of these techniques are the main feature of this paper.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleTechniques to Predict Dislocation Generation During Growth of Silicon Ribbon
    typeJournal Paper
    journal volume109
    journal issue3
    journal titleJournal of Engineering Materials and Technology
    identifier doi10.1115/1.3225965
    journal fristpage209
    journal lastpage215
    identifier eissn1528-8889
    keywordsDislocations
    keywordsSilicon
    keywordsDislocation density
    keywordsStress
    keywordsBuckling
    keywordsTemperature
    keywordsManufacturing
    keywordsSolar cells
    keywordsElectric power generation AND Flat plates
    treeJournal of Engineering Materials and Technology:;1987:;volume( 109 ):;issue: 003
    contenttypeFulltext
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