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contributor authorC. T. Tsai
contributor authorR. J. De Angelis
contributor authorO. W. Dillon
date accessioned2017-05-08T23:24:50Z
date available2017-05-08T23:24:50Z
date copyrightJuly, 1987
date issued1987
identifier issn0094-4289
identifier otherJEMTA8-26917#209_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/102508
description abstractThis paper describes the numerical techniques that are used to predict stresses, strains, dislocation densities, and buckling during the growth of flat plate silicon. High quality silicon ribbon would be an ideal starting material for manufacturing solar cells for electrical power generation. The techniques developed are uniquely related to the material model that is used which is a generalization of the silicon model reported by Hassen in Germany, Sumino in Japan and their co-workers. The novelty of the model is that it accounts for a changing dislocation density and through this, the plastic strain rate also changes with the dislocation density. The rate of dislocation generation depends on the stresses, temperature as well as the existing dislocation density. The numerical techniques that are discussed incorporate this novel material model in the analysis of the silicon ribbon growing process. This approach requires that the stresses and dislocation density due to a complex thermal field be determined. The details of these techniques are the main feature of this paper.
publisherThe American Society of Mechanical Engineers (ASME)
titleTechniques to Predict Dislocation Generation During Growth of Silicon Ribbon
typeJournal Paper
journal volume109
journal issue3
journal titleJournal of Engineering Materials and Technology
identifier doi10.1115/1.3225965
journal fristpage209
journal lastpage215
identifier eissn1528-8889
keywordsDislocations
keywordsSilicon
keywordsDislocation density
keywordsStress
keywordsBuckling
keywordsTemperature
keywordsManufacturing
keywordsSolar cells
keywordsElectric power generation AND Flat plates
treeJournal of Engineering Materials and Technology:;1987:;volume( 109 ):;issue: 003
contenttypeFulltext


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