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    Damage Mechanics of Surface Mount Technology Solder Joints Under Concurrent Thermal and Dynamic Loading 

    Source: Journal of Electronic Packaging:;1999:;volume( 121 ):;issue: 002:;page 61
    Author(s): R. Chandaroy; C. Basaran
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In the electronic industry, the dominant failure mode for solder joints is assumed to be thermal cycling. When semiconductor devices are used in vibrating environment, such as automotive and ...
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    Nonlinear Dynamic Analysis of Surface Mount Interconnects: Part II—Applications 

    Source: Journal of Electronic Packaging:;1999:;volume( 121 ):;issue: 001:;page 12
    Author(s): C. Basaran; R. Chandaroy
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Using the unified constitutive model and the finite element procedure presented in Part I (the preceding paper), a material nonlinear time domain dynamic analysis of a solder joint was studied ...
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    Nonlinear Dynamic Analysis of Surface Mount Interconnects: Part I—Theory 

    Source: Journal of Electronic Packaging:;1999:;volume( 121 ):;issue: 001:;page 8
    Author(s): C. Basaran; R. Chandaroy
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Solder joints are commonly used in surface mount technology microelectronics packaging. It is well known that the dominant failure mode for solder joints is thermal fatigue. When semiconductor ...
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