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    Co-Packaged Optics—Heterogeneous Integration of Photonic Integrated Circuits and Electronic Integrated Circuits 

    Source: Journal of Electronic Packaging:;2024:;volume( 147 ):;issue: 001:;page 11004-1
    Author(s): Lau, John H.
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The trends in co-packaged optics (CPO) will be investigated in this study. Emphasis is placed on the heterogeneous integration of photonic integrated circuit (PIC) and electronic IC (EIC). In particular, two-dimensional ...
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    Thermoelastic Solutions for a Semi-Infinite Substrate With a Powered Electronic Device 

    Source: Journal of Electronic Packaging:;1992:;volume( 114 ):;issue: 003:;page 353
    Author(s): John H. Lau
    Publisher: The American Society of Mechanical Engineers (ASME)
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    Discussion of “Residual Shear Strength Measured by Laboratory Tests and Mobilized in Landslides” by Gholamreza Mesri and Nejan Huvaj-Sarihan 

    Source: Journal of Geotechnical and Geoenvironmental Engineering:;2013:;Volume ( 139 ):;issue: 009
    Author(s): John H.; Schmertmann
    Publisher: American Society of Civil Engineers
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    Bending and Twisting of 60Sn40Pb Solder Interconnects With Creep 

    Source: Journal of Electronic Packaging:;1994:;volume( 116 ):;issue: 002:;page 154
    Author(s): John H. Lau
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: An exact analysis is presented for the creep deformation of a thin-walled circular solder cylinder under the actions of bending and twisting moments. Dimensionless interaction curves and charts ...
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    On Murphy’s Integrated Circuit Yield Integral 

    Source: Journal of Electronic Packaging:;1995:;volume( 117 ):;issue: 002:;page 159
    Author(s): John H. Lau
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: An approximated closed-form integrated circuit (IC) yield formula based on a Gaussian defect density distribution for the compounder in Murphy’s yield integral is presented. Also, a closed-form ...
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    Reliability of Lead-Free Solder Joints 

    Source: Journal of Electronic Packaging:;2006:;volume( 128 ):;issue: 003:;page 297
    Author(s): John H. Lau
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Reliability of the restriction of the use of certain hazardous substances in electrical and electronic equipment compliant products is investigated in this study. Emphasis is placed on the ...
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    Discussion: “A New Matrix Formula for the Inverse Laplace Transformation” (Chen, C. F., and Yates, R. E., 1967, ASME J. Basic Eng., 89, pp. 269–272) 

    Source: Journal of Fluids Engineering:;1967:;volume( 089 ):;issue: 002:;page 272
    Author(s): John H. George
    Publisher: The American Society of Mechanical Engineers (ASME)
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    An Observational and Theoretical Study of Colorado Lee Cyclogenesis 

    Source: Journal of the Atmospheric Sciences:;1989:;Volume( 047 ):;issue: 013:;page 1541
    Author(s): Clark, John H. E.
    Publisher: American Meteorological Society
    Abstract: A cyclogenesis event that occurred over Colorado in early March of 1981 is the focus of this study. Two features that seemed to play a role in storm initiation were a traveling upper troposphere disturbance associated with ...
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    A Simple Question About Consolidation 

    Source: Journal of Geotechnical Engineering:;1983:;Volume ( 109 ):;issue: 001
    Author(s): John H. Schmertmann
    Publisher: American Society of Civil Engineers
    Abstract: The author poses a question about what happens to the lateral stress of a normally consolidated clay aging in an oedometer at constant vertical stress. A written and verbal survey of 32 senior engineers from research and ...
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    Discussion of “Shear Strength of Clay at Different Shear Rates” by Ivan B. Gratchev and Kyoji Sassa 

    Source: Journal of Geotechnical and Geoenvironmental Engineering:;2016:;Volume ( 142 ):;issue: 011
    Author(s): John H. Schmertmann
    Publisher: American Society of Civil Engineers
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