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    A Fractional-Factorial Numerical Technique for Stress Analysis of Glass-To-Metal Lead Seals 

    Source: Journal of Electronic Packaging:;1994:;volume( 116 ):;issue: 002:;page 98
    Author(s): Barry Mathieu; Abhijit Dasgupta
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Fracture of glass seals in metallic hermetic electronic packaging is a significant failure mode because it may lead to moisture ingress and also to loss of load carrying capacity of the glass ...
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    A Nested Finite Element Methodology (NFEM) for Stress Analysis of Electronic Products—Part I: Theory and Formulation 

    Source: Journal of Electronic Packaging:;2001:;volume( 123 ):;issue: 002:;page 141
    Author(s): Krishna Darbha; Abhijit Dasgupta
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In this paper, the authors present a stress analysis technique based on a novel nested finite element methodology (NFEM). The NFEM is similar in concept to an earlier proposed multi-domain ...
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    A Nested Finite Element Methodology (NFEM) for Stress Analysis of Electronic Products—Part II: Durability Analysis of Flip Chip and Chip Scale Interconnects 

    Source: Journal of Electronic Packaging:;2001:;volume( 123 ):;issue: 002:;page 147
    Author(s): Krishna Darbha; Abhijit Dasgupta
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The nested finite element methodology (NFEM) presented in Part I of this series, is used in this paper to analyze the viscoplastic stress-state in a flip-chip-on-board (FCOB) and a chip scale ...
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    Micro-Mechanics of Creep-Fatigue Damage in PB-SN Solder Due to Thermal Cycling—Part I: Formulation 

    Source: Journal of Electronic Packaging:;2002:;volume( 124 ):;issue: 003:;page 292
    Author(s): Pradeep Sharma; Abhijit Dasgupta
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper presents a micro-mechanistic approach for modeling fatigue damage initiation due to cyclic creep in eutectic Pb-Sn solder. Damage mechanics due to cyclic creep is modeled with void ...
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    Micro-Mechanics of Creep-Fatigue Damage in PB-SN Solder Due to Thermal Cycling—Part II: Mechanistic Insights and Cyclic Durability Predictions From Monotonic Data 

    Source: Journal of Electronic Packaging:;2002:;volume( 124 ):;issue: 003:;page 298
    Author(s): Pradeep Sharma; Abhijit Dasgupta
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper illustrates the micromechanics approach to cyclic creep-fatigue damage of Pb-Sn, developed by the authors with the help of a simple case study. It is demonstrated that durability ...
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    Large‐Scale Model Test on Square Box Culvert Backfilled with Sand 

    Source: Journal of Geotechnical Engineering:;1991:;Volume ( 117 ):;issue: 001
    Author(s): Abhijit Dasgupta; Bratish Sengupta
    Publisher: American Society of Civil Engineers
    Abstract: A comparison is made of the experimental and theoretical values of bending moment, shear force, deflection, and pressure for a reinforced concrete box culvert measuring 1,200 by 1,200 mm (inside dimensions) by 9-m long and ...
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    Damage Initiation and Propagation in Voided Joints: Modeling and Experiment 

    Source: Journal of Electronic Packaging:;2008:;volume( 130 ):;issue: 001:;page 11008
    Author(s): Leila Jannesari Ladani; Abhijit Dasgupta
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This study examines damage initiation and propagation in solder joints with voids, under thermomechanical cyclic loading. An accelerated thermal cycling test is conducted on printed wiring assemblies ...
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    Effect of Voids on Thermomechanical Durability of Pb-Free BGA Solder Joints: Modeling and Simulation 

    Source: Journal of Electronic Packaging:;2007:;volume( 129 ):;issue: 003:;page 273
    Author(s): Leila Jannesari Ladani; Abhijit Dasgupta
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The effect of process-induced voids on the durability of Sn–Pb and Pb-free solder interconnects in electronic products is not clearly understood. Experimental studies have provided conflicting ...
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    A Probabilistic Approach for Predicting Thermal Fatigue Life of Wire Bonding in Microelectronics 

    Source: Journal of Electronic Packaging:;1991:;volume( 113 ):;issue: 003:;page 275
    Author(s): Jun Ming Hu; Michael Pecht; Abhijit Dasgupta
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Wire bond connections are susceptible to fatigue failure as a result of various thermo-mechanical damage mechanisms during the component operation life. Because of uncertainties arising from the ...
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    Isothermal Mechanical Durability of Three Selected PB-Free Solders: Sn3.9Ag0.6Cu, Sn3.5Ag, and Sn0.7Cu 

    Source: Journal of Electronic Packaging:;2005:;volume( 127 ):;issue: 004:;page 512
    Author(s): Qian Zhang; Abhijit Dasgupta; Peter Haswell
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This study is motivated by the urgent need in the electronics industry for mechanical properties and durability of Pb-free solders because the use of Pb will be banned in the EU by July 1, ...
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