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    A Theoretical and Experimental Study on High-Efficiency and Ultra-Low Damage Machining of Diamond

    Source: Journal of Manufacturing Science and Engineering:;2023:;volume( 145 ):;issue: 007::page 71006-1
    Author:
    Yuan, Song
    ,
    Guo, Xiaoguang
    ,
    Wang, Hao
    ,
    Gao, Shang
    DOI: 10.1115/1.4057008
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Diamond has attracted extensive attention from many scholars due to its characteristics, whereas the high-efficiency and ultra-low damage machining regarding diamond is still a bottleneck restricting its applications. Herein, a new polishing equipment was built, and a new method of photochemical mechanical polishing (PCMP) combining mechanical + chemical + optical field coupling was proposed to solve the problem of high-efficiency and ultra-low damage machining of diamond. The experimental results show that the sub-nanoscale surface of Ra 0.071 nm, rms 0.090 nm, Rz 0.943 nm, and the micro removal rate per hour can be obtained after PCMP for the first time. Transmission electron microscope (TEM) and X-ray photoelectron spectroscopy (XPS) results manifest that the damage of the diamond substrate after PCMP is amorphous carbon damage, and the damage thickness of amorphous carbon is only 0.6 nm. The PCMP model of ReaxFF molecular dynamics (MD) simulation was constructed to elucidate the microscopic mechanism during the diamond PCMP process. Simulation results show that ultraviolet (UV) irradiation increases the activity of diamond by decreasing the stability of substrate and weakening the C-C bonds, thus promoting the oxidation of diamond surface. Our experimental and theoretical research provides an insight for realizing high-efficiency and ultra-low damage machining of diamond.
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      A Theoretical and Experimental Study on High-Efficiency and Ultra-Low Damage Machining of Diamond

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    http://yetl.yabesh.ir/yetl1/handle/yetl/4292298
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    contributor authorYuan, Song
    contributor authorGuo, Xiaoguang
    contributor authorWang, Hao
    contributor authorGao, Shang
    date accessioned2023-08-16T18:40:17Z
    date available2023-08-16T18:40:17Z
    date copyright3/21/2023 12:00:00 AM
    date issued2023
    identifier issn1087-1357
    identifier othermanu_145_7_071006.pdf
    identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4292298
    description abstractDiamond has attracted extensive attention from many scholars due to its characteristics, whereas the high-efficiency and ultra-low damage machining regarding diamond is still a bottleneck restricting its applications. Herein, a new polishing equipment was built, and a new method of photochemical mechanical polishing (PCMP) combining mechanical + chemical + optical field coupling was proposed to solve the problem of high-efficiency and ultra-low damage machining of diamond. The experimental results show that the sub-nanoscale surface of Ra 0.071 nm, rms 0.090 nm, Rz 0.943 nm, and the micro removal rate per hour can be obtained after PCMP for the first time. Transmission electron microscope (TEM) and X-ray photoelectron spectroscopy (XPS) results manifest that the damage of the diamond substrate after PCMP is amorphous carbon damage, and the damage thickness of amorphous carbon is only 0.6 nm. The PCMP model of ReaxFF molecular dynamics (MD) simulation was constructed to elucidate the microscopic mechanism during the diamond PCMP process. Simulation results show that ultraviolet (UV) irradiation increases the activity of diamond by decreasing the stability of substrate and weakening the C-C bonds, thus promoting the oxidation of diamond surface. Our experimental and theoretical research provides an insight for realizing high-efficiency and ultra-low damage machining of diamond.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleA Theoretical and Experimental Study on High-Efficiency and Ultra-Low Damage Machining of Diamond
    typeJournal Paper
    journal volume145
    journal issue7
    journal titleJournal of Manufacturing Science and Engineering
    identifier doi10.1115/1.4057008
    journal fristpage71006-1
    journal lastpage71006-7
    page7
    treeJournal of Manufacturing Science and Engineering:;2023:;volume( 145 ):;issue: 007
    contenttypeFulltext
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