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    Calibration of Cellular Automaton Model for Microstructure Prediction in Additive Manufacturing Using Dissimilarity Score

    Source: Journal of Manufacturing Science and Engineering:;2023:;volume( 145 ):;issue: 006::page 61002-1
    Author:
    Ghumman, Umar Farooq
    ,
    Fang, Lichao
    ,
    Wagner, Gregory J.
    ,
    Chen, Wei
    DOI: 10.1115/1.4056690
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Additive manufacturing (AM) simulations offer an alternative to expensive AM experiments to study the effects of processing conditions on granular microstructures. Existing AM simulations lack support from reliable validation techniques. The stochastic nature and spatial heterogeneity of microstructures make it difficult to validate the simulated microstructures against experimentally obtained images through statistical measures such as average grain size. Another challenge is the lack of reliable and automated methods to calibrate the model parameters, which are unknown and difficult to measure directly from experiments. To overcome these two challenges, we first present a novel metric to quantify the difference between granular microstructures. Then, using this metric in conjunction with Bayesian optimization, we present a framework that can be used to reliably and efficiently calibrate the model parameters. We employ this framework to first calibrate the substrate microstructure simulation and then the laser scan microstructure simulation for Inconel 625. Results show that the framework allows successful calibration of the model parameters in just a small number of simulations.
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      Calibration of Cellular Automaton Model for Microstructure Prediction in Additive Manufacturing Using Dissimilarity Score

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    http://yetl.yabesh.ir/yetl1/handle/yetl/4292287
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    contributor authorGhumman, Umar Farooq
    contributor authorFang, Lichao
    contributor authorWagner, Gregory J.
    contributor authorChen, Wei
    date accessioned2023-08-16T18:39:52Z
    date available2023-08-16T18:39:52Z
    date copyright2/13/2023 12:00:00 AM
    date issued2023
    identifier issn1087-1357
    identifier othermanu_145_6_061002.pdf
    identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4292287
    description abstractAdditive manufacturing (AM) simulations offer an alternative to expensive AM experiments to study the effects of processing conditions on granular microstructures. Existing AM simulations lack support from reliable validation techniques. The stochastic nature and spatial heterogeneity of microstructures make it difficult to validate the simulated microstructures against experimentally obtained images through statistical measures such as average grain size. Another challenge is the lack of reliable and automated methods to calibrate the model parameters, which are unknown and difficult to measure directly from experiments. To overcome these two challenges, we first present a novel metric to quantify the difference between granular microstructures. Then, using this metric in conjunction with Bayesian optimization, we present a framework that can be used to reliably and efficiently calibrate the model parameters. We employ this framework to first calibrate the substrate microstructure simulation and then the laser scan microstructure simulation for Inconel 625. Results show that the framework allows successful calibration of the model parameters in just a small number of simulations.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleCalibration of Cellular Automaton Model for Microstructure Prediction in Additive Manufacturing Using Dissimilarity Score
    typeJournal Paper
    journal volume145
    journal issue6
    journal titleJournal of Manufacturing Science and Engineering
    identifier doi10.1115/1.4056690
    journal fristpage61002-1
    journal lastpage61002-11
    page11
    treeJournal of Manufacturing Science and Engineering:;2023:;volume( 145 ):;issue: 006
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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