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contributor authorBarrera, Crystal;Ajay, Paras;Mallavarapu, Akhila;Hrdy, Mark;Sreenivasan, S. V.
date accessioned2023-04-06T12:56:02Z
date available2023-04-06T12:56:02Z
date copyright9/27/2022 12:00:00 AM
date issued2022
identifier issn21660468
identifier otherjmnm_010_02_021002.pdf
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4288781
description abstractMetalassisted chemical etching (MacEtch) of silicon shows reliable vertical anisotropic wet etching only in singlecrystal silicon, which limits its applications to a small number of devices. This work extends the capabilities of MacEtch to polysilicon which has potential to enable highvolume and costsensitive applications such as optical metasurfaces, anodes for high capacity and flexible batteries, electrostatic supercapacitors, sensors, nanofluidic deterministic lateral displacement devices, etc. This work presents a MacEtch of polysilicon that produces nanostructure arrays with sub50 nm resolution and anisotropic profile. The three demonstrated structures are pillars of 5:1 aspect ratio and 50 nm spacing for comparison to single crystal silicon MacEtch literature, pillars of 30 nm spacing, and a diamond pillar array with sharp corners to establish resolution limits of polysilicon MacEtch.
publisherThe American Society of Mechanical Engineers (ASME)
titleMetal Assisted Chemical Etch of Polycrystalline Silicon
typeJournal Paper
journal volume10
journal issue2
journal titleJournal of Micro and NanoManufacturing
identifier doi10.1115/1.4055401
journal fristpage21002
journal lastpage210026
page6
treeJournal of Micro and NanoManufacturing:;2022:;volume( 010 ):;issue: 002
contenttypeFulltext


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