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    Experimental Test and Estimation of the Equivalent Thermoelectric Properties for a Thermoelectric Module

    Source: Journal of Energy Resources Technology:;2021:;volume( 143 ):;issue: 012::page 0122102-1
    Author:
    Luo, Ding
    ,
    Wang, Ruochen
    DOI: 10.1115/1.4050132
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: When analyzing and optimizing the performance of thermoelectric (TE) devices in theory, Seebeck coefficient, thermal conductivity, and electrical resistivity are indispensable TE properties. However, most manufacturers do not provide or overestimate these data. Under the consideration of temperature dependence, this paper discloses an experimental measurement approach to estimate the equivalent Seebeck coefficient, thermal conductivity, and electrical resistivity of a TE module. A thermal resistance network is also established to work out the hot and cold side temperatures of TE legs. Based on a designed test bench, required temperature and electrical parameters in both open circuit and closed circuit are measured and recorded, where the data of open circuit are used to calculate the equivalent Seebeck coefficient and thermal conductivity, and the data of closed circuit are used to calculate the equivalent electrical resistivity. To eliminate the error of parasitic internal resistance, a thermal-electric finite element model is adopted to modify the equivalent electrical resistivity. The modification results indicate that the equivalent internal resistance is about 1.033 times the real internal resistance, and the ratio is related to the working temperature. This work provides a new idea to obtain the TE material properties via an experimental test.
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      Experimental Test and Estimation of the Equivalent Thermoelectric Properties for a Thermoelectric Module

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/4278479
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    contributor authorLuo, Ding
    contributor authorWang, Ruochen
    date accessioned2022-02-06T05:39:11Z
    date available2022-02-06T05:39:11Z
    date copyright3/4/2021 12:00:00 AM
    date issued2021
    identifier issn0195-0738
    identifier otherjert_143_12_122102.pdf
    identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4278479
    description abstractWhen analyzing and optimizing the performance of thermoelectric (TE) devices in theory, Seebeck coefficient, thermal conductivity, and electrical resistivity are indispensable TE properties. However, most manufacturers do not provide or overestimate these data. Under the consideration of temperature dependence, this paper discloses an experimental measurement approach to estimate the equivalent Seebeck coefficient, thermal conductivity, and electrical resistivity of a TE module. A thermal resistance network is also established to work out the hot and cold side temperatures of TE legs. Based on a designed test bench, required temperature and electrical parameters in both open circuit and closed circuit are measured and recorded, where the data of open circuit are used to calculate the equivalent Seebeck coefficient and thermal conductivity, and the data of closed circuit are used to calculate the equivalent electrical resistivity. To eliminate the error of parasitic internal resistance, a thermal-electric finite element model is adopted to modify the equivalent electrical resistivity. The modification results indicate that the equivalent internal resistance is about 1.033 times the real internal resistance, and the ratio is related to the working temperature. This work provides a new idea to obtain the TE material properties via an experimental test.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleExperimental Test and Estimation of the Equivalent Thermoelectric Properties for a Thermoelectric Module
    typeJournal Paper
    journal volume143
    journal issue12
    journal titleJournal of Energy Resources Technology
    identifier doi10.1115/1.4050132
    journal fristpage0122102-1
    journal lastpage0122102-11
    page11
    treeJournal of Energy Resources Technology:;2021:;volume( 143 ):;issue: 012
    contenttypeFulltext
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