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    Image-Based Surface Defect Detection Using Deep Learning: A Review

    Source: Journal of Computing and Information Science in Engineering:;2021:;volume( 021 ):;issue: 004::page 040801-1
    Author:
    Bhatt, Prahar M.
    ,
    Malhan, Rishi K.
    ,
    Rajendran, Pradeep
    ,
    Shah, Brual C.
    ,
    Thakar, Shantanu
    ,
    Yoon, Yeo Jung
    ,
    Gupta, Satyandra K.
    DOI: 10.1115/1.4049535
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Automatically detecting surface defects from images is an essential capability in manufacturing applications. Traditional image processing techniques are useful in solving a specific class of problems. However, these techniques do not handle noise, variations in lighting conditions, and backgrounds with complex textures. In recent times, deep learning has been widely explored for use in automation of defect detection. This survey article presents three different ways of classifying various efforts in literature for surface defect detection using deep learning techniques. These three ways are based on defect detection context, learning techniques, and defect localization and classification method respectively. This article also identifies future research directions based on the trends in the deep learning area.
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      Image-Based Surface Defect Detection Using Deep Learning: A Review

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    http://yetl.yabesh.ir/yetl1/handle/yetl/4277722
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    • Journal of Computing and Information Science in Engineering

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    contributor authorBhatt, Prahar M.
    contributor authorMalhan, Rishi K.
    contributor authorRajendran, Pradeep
    contributor authorShah, Brual C.
    contributor authorThakar, Shantanu
    contributor authorYoon, Yeo Jung
    contributor authorGupta, Satyandra K.
    date accessioned2022-02-05T22:32:24Z
    date available2022-02-05T22:32:24Z
    date copyright2/9/2021 12:00:00 AM
    date issued2021
    identifier issn1530-9827
    identifier otherjcise_21_4_040801.pdf
    identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4277722
    description abstractAutomatically detecting surface defects from images is an essential capability in manufacturing applications. Traditional image processing techniques are useful in solving a specific class of problems. However, these techniques do not handle noise, variations in lighting conditions, and backgrounds with complex textures. In recent times, deep learning has been widely explored for use in automation of defect detection. This survey article presents three different ways of classifying various efforts in literature for surface defect detection using deep learning techniques. These three ways are based on defect detection context, learning techniques, and defect localization and classification method respectively. This article also identifies future research directions based on the trends in the deep learning area.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleImage-Based Surface Defect Detection Using Deep Learning: A Review
    typeJournal Paper
    journal volume21
    journal issue4
    journal titleJournal of Computing and Information Science in Engineering
    identifier doi10.1115/1.4049535
    journal fristpage040801-1
    journal lastpage040801-15
    page15
    treeJournal of Computing and Information Science in Engineering:;2021:;volume( 021 ):;issue: 004
    contenttypeFulltext
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