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    A Systematic Method for Developing Harmonic Cantilevers for Atomic Force Microscopy

    Source: Journal of Mechanical Design:;2017:;volume( 139 ):;issue: 001::page 12303
    Author:
    Zhu, Benliang
    ,
    Zimmermann, Soren
    ,
    Zhang, Xianmin
    ,
    Fatikow, Sergej
    DOI: 10.1115/1.4034836
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper proposes a method for developing harmonic cantilevers for tapping mode atomic force microscopy (AFM). The natural frequencies of an AFM cantilever are tuned by inserting gridiron holes with specific sizes and locations, such that the higher order resonance frequencies can be assigned to be integer harmonics generated by the nonlinear tip–sample interaction force. The cantilever is modeled using the vibration theory of the Timoshenko beam with a nonuniform cross section. The designed cantilever is fabricated by modifying a commercial cantilever through focused ion beam (FIB) milling. The resonant frequencies of the designed cantilever are verified using a commercial AFM.
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      A Systematic Method for Developing Harmonic Cantilevers for Atomic Force Microscopy

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    http://yetl.yabesh.ir/yetl1/handle/yetl/4234906
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    contributor authorZhu, Benliang
    contributor authorZimmermann, Soren
    contributor authorZhang, Xianmin
    contributor authorFatikow, Sergej
    date accessioned2017-11-25T07:18:01Z
    date available2017-11-25T07:18:01Z
    date copyright2016/14/10
    date issued2017
    identifier issn1050-0472
    identifier othermd_139_01_012303.pdf
    identifier urihttp://138.201.223.254:8080/yetl1/handle/yetl/4234906
    description abstractThis paper proposes a method for developing harmonic cantilevers for tapping mode atomic force microscopy (AFM). The natural frequencies of an AFM cantilever are tuned by inserting gridiron holes with specific sizes and locations, such that the higher order resonance frequencies can be assigned to be integer harmonics generated by the nonlinear tip–sample interaction force. The cantilever is modeled using the vibration theory of the Timoshenko beam with a nonuniform cross section. The designed cantilever is fabricated by modifying a commercial cantilever through focused ion beam (FIB) milling. The resonant frequencies of the designed cantilever are verified using a commercial AFM.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleA Systematic Method for Developing Harmonic Cantilevers for Atomic Force Microscopy
    typeJournal Paper
    journal volume139
    journal issue1
    journal titleJournal of Mechanical Design
    identifier doi10.1115/1.4034836
    journal fristpage12303
    journal lastpage012303-6
    treeJournal of Mechanical Design:;2017:;volume( 139 ):;issue: 001
    contenttypeFulltext
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    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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