contributor author | Zhu, Benliang | |
contributor author | Zimmermann, Soren | |
contributor author | Zhang, Xianmin | |
contributor author | Fatikow, Sergej | |
date accessioned | 2017-11-25T07:18:01Z | |
date available | 2017-11-25T07:18:01Z | |
date copyright | 2016/14/10 | |
date issued | 2017 | |
identifier issn | 1050-0472 | |
identifier other | md_139_01_012303.pdf | |
identifier uri | http://138.201.223.254:8080/yetl1/handle/yetl/4234906 | |
description abstract | This paper proposes a method for developing harmonic cantilevers for tapping mode atomic force microscopy (AFM). The natural frequencies of an AFM cantilever are tuned by inserting gridiron holes with specific sizes and locations, such that the higher order resonance frequencies can be assigned to be integer harmonics generated by the nonlinear tip–sample interaction force. The cantilever is modeled using the vibration theory of the Timoshenko beam with a nonuniform cross section. The designed cantilever is fabricated by modifying a commercial cantilever through focused ion beam (FIB) milling. The resonant frequencies of the designed cantilever are verified using a commercial AFM. | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | A Systematic Method for Developing Harmonic Cantilevers for Atomic Force Microscopy | |
type | Journal Paper | |
journal volume | 139 | |
journal issue | 1 | |
journal title | Journal of Mechanical Design | |
identifier doi | 10.1115/1.4034836 | |
journal fristpage | 12303 | |
journal lastpage | 012303-6 | |
tree | Journal of Mechanical Design:;2017:;volume( 139 ):;issue: 001 | |
contenttype | Fulltext | |