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contributor authorYuan, W. K.
contributor authorLong, J. M.
contributor authorDing, Y.
contributor authorWang, G. F.
date accessioned2017-11-25T07:15:40Z
date available2017-11-25T07:15:40Z
date copyright2016/7/11
date issued2017
identifier issn0021-8936
identifier otherjam_084_01_011012.pdf
identifier urihttp://138.201.223.254:8080/yetl1/handle/yetl/4233620
description abstractFor micro/nanosized contact problems, the influence of surface tension becomes prominent. Based on the solution of a point force acting on an elastic half space with surface tension, we formulate the contact between a rigid ellipsoid and an elastic substrate. The corresponding singular integral equation is solved numerically by using the Gauss–Chebyshev quadrature formula. When the size of contact region is comparable with the elastocapillary length, surface tension significantly alters the distribution of contact pressure and decreases the contact area and indent depth, compared to the classical Hertzian prediction. We generalize the explicit expression of the equivalent contact radius, the indent depth, and the eccentricity of contact ellipse with respect to the external load, which provides the fundament for analyzing nanoindentation tests and contact of rough surfaces.
publisherThe American Society of Mechanical Engineers (ASME)
titleMicro/Nanocontact Between a Rigid Ellipsoid and an Elastic Substrate With Surface Tension
typeJournal Paper
journal volume84
journal issue1
journal titleJournal of Applied Mechanics
identifier doi10.1115/1.4035032
journal fristpage11012
journal lastpage011012-7
treeJournal of Applied Mechanics:;2017:;volume( 084 ):;issue: 001
contenttypeFulltext


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