contributor author | Hubbard, Kenneth G. | |
contributor author | You, Jinsheng | |
date accessioned | 2017-06-09T17:22:56Z | |
date available | 2017-06-09T17:22:56Z | |
date copyright | 2005/10/01 | |
date issued | 2005 | |
identifier issn | 0739-0572 | |
identifier other | ams-84174.pdf | |
identifier uri | http://onlinelibrary.yabesh.ir/handle/yetl/4227481 | |
description abstract | Both the spatial regression test (SRT) and inverse distance weighting (IDW) methods have been applied to provide estimates for the maximum air temperature (Tmax) and the minimum air temperature (Tmin) in the Applied Climate Information System (ACIS). This is critical to the processes of estimating missing data and identifying suspect data and is undertaken here to ensure quality data in ACIS. The SRT method was previously found to be superior to the IDW method; however, the sensitivity of the performance of both methods to input parameters has not been evaluated. A set of analyses is presented for both methods whereby the sensitivity to the radius of inclusion, the regression time window, the regression time offset, and the number of stations used to make the estimates are examined. Comparisons were also conducted between the SRT and the IDW methods. The performance of the SRT method stabilized when 10 or more stations were applied in the estimates. The optimal number of stations for the IDW method varies from only a few to 30. The results indicate that the best estimates obtained using the IDW method are still inferior to the worst estimates obtained using the SRT method. | |
publisher | American Meteorological Society | |
title | Sensitivity Analysis of Quality Assurance Using the Spatial Regression Approach—A Case Study of the Maximum/Minimum Air Temperature | |
type | Journal Paper | |
journal volume | 22 | |
journal issue | 10 | |
journal title | Journal of Atmospheric and Oceanic Technology | |
identifier doi | 10.1175/JTECH1790.1 | |
journal fristpage | 1520 | |
journal lastpage | 1530 | |
tree | Journal of Atmospheric and Oceanic Technology:;2005:;volume( 022 ):;issue: 010 | |
contenttype | Fulltext | |