contributor author | Qian, Guian | |
contributor author | Niffenegger, Markus | |
date accessioned | 2017-05-09T01:22:52Z | |
date available | 2017-05-09T01:22:52Z | |
date issued | 2015 | |
identifier issn | 0094-9930 | |
identifier other | pvt_137_01_011204.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/159419 | |
description abstract | The integrity of a reactor pressure vessel (RPV) related to pressurized thermal shocks (PTSs) has been extensively studied. This paper introduces the method of using fracture mechanics for the integrity analysis of a RPV subjected to PTS transients. A 3D finite element (FE) model is used to perform thermal and fracture mechanics analyses by considering both elastic and elastic–plastic material models. The results show that the linear elastic analysis leads to a more conservative result than the elastic–plastic analysis. The variation of the Tstress and Qstress (crack tip constraint loss) of a surface crack in a RPV subjected to PTSs is studied. A shallow crack is assumed in the RPV and the corresponding constraint effect on fracture toughness of the material is quantified by the K–T method. The safety margin of the RPV is larger based on the K–T approach than based only on the K approach. The J–Q method with the modified boundary layer formulation (MBL) is used for the crack tip constraint analysis by considering elastic–plastic material properties. For all transient times, the real stress is lower than that calculated from small scale yielding (SSY) due to the loss of crack tip constraint. | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | Investigation on Constraint Effect of a Reactor Pressure Vessel Subjected to Pressurized Thermal Shocks | |
type | Journal Paper | |
journal volume | 137 | |
journal issue | 1 | |
journal title | Journal of Pressure Vessel Technology | |
identifier doi | 10.1115/1.4028017 | |
journal fristpage | 11204 | |
journal lastpage | 11204 | |
identifier eissn | 1528-8978 | |
tree | Journal of Pressure Vessel Technology:;2015:;volume( 137 ):;issue: 001 | |
contenttype | Fulltext | |