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contributor authorCheng, Huanyu
contributor authorSong, Jizhou
date accessioned2017-05-09T01:04:38Z
date available2017-05-09T01:04:38Z
date issued2014
identifier issn0021-8936
identifier otherjam_081_02_024501.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/153742
description abstractBuckling of stiff thin films on compliant substrates enables many new applications, such as stretchable electronics. Song et al. [2008, “Buckling of a Stiff Thin Film on a Compliant Substrate in Large Deformation,â€‌ Int. J. Solids Struct., 45(10), pp. 3107–3121] developed a finite deformation theory to explain the buckled amplitude and wavelength very well. This theory not only accounts for finite geometry change, but also the finite strain and a nonlinear constitutive model for the substrate. To provide a better physical insight, this paper investigates those three effects, and shows that finite geometry change dominates in the finite deformation theory and the simplified analysis leads to results that agree well with experiments and the finite element method.
publisherThe American Society of Mechanical Engineers (ASME)
titleA Simply Analytic Study of Buckled Thin Films on Compliant Substrates
typeJournal Paper
journal volume81
journal issue2
journal titleJournal of Applied Mechanics
identifier doi10.1115/1.4025306
journal fristpage24501
journal lastpage24501
identifier eissn1528-9036
treeJournal of Applied Mechanics:;2014:;volume( 081 ):;issue: 002
contenttypeFulltext


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