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contributor authorMarconnet, Amy M.
contributor authorAsheghi, Mehdi
contributor authorGoodson, Kenneth E.
date accessioned2017-05-09T00:59:47Z
date available2017-05-09T00:59:47Z
date issued2013
identifier issn0022-1481
identifier otherht_135_6_061601.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/152137
description abstractSilicononinsulator (SOI) technology has sparked advances in semiconductor and MEMs manufacturing and revolutionized our ability to study phonon transport phenomena by providing singlecrystal silicon layers with thickness down to a few tens of nanometers. These nearly perfect crystalline silicon layers are an ideal platform for studying ballistic phonon transport and the coupling of boundary scattering with other mechanisms, including impurities and periodic pores. Early studies showed clear evidence of the size effect on thermal conduction due to phonon boundary scattering in films down to 20 nm thick and provided the first compelling room temperature evidence for the Casimir limit at room temperature. More recent studies on ultrathin films and periodically porous thin films are exploring the possibility of phonon dispersion modifications in confined geometries and porous films.
publisherThe American Society of Mechanical Engineers (ASME)
titleFrom the Casimir Limit to Phononic Crystals: 20 Years of Phonon Transport Studies Using Silicon on Insulator Technology
typeJournal Paper
journal volume135
journal issue6
journal titleJournal of Heat Transfer
identifier doi10.1115/1.4023577
journal fristpage61601
journal lastpage61601
identifier eissn1528-8943
treeJournal of Heat Transfer:;2013:;volume( 135 ):;issue: 006
contenttypeFulltext


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