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contributor authorYan, Chunji
contributor authorMa, H. B.
date accessioned2017-05-09T00:59:31Z
date available2017-05-09T00:59:31Z
date issued2013
identifier issn0022-1481
identifier otherht_135_3_031501.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/152028
description abstractA mathematical model predicting heat transfer and film thickness in thinfilm region is developed herein. Utilizing dimensionless analysis, analytical solutions have been obtained for heat flux distribution, total heat transfer rate per unit length, location of the maximum heat flux and ratio of conduction thermal resistance to convection thermal resistance in the evaporating film region. These analytical solutions show that the maximum dimensionless heat flux is constant which is independent of the superheat. Maximum total heat transfer rate is determined for a given film region. The ratio of conduction thermal resistance to convection thermal resistance is a function of dimensionless film thickness. This work will lead to a better understanding of heat transfer and fluid flow occurring in the evaporating film region.
publisherThe American Society of Mechanical Engineers (ASME)
titleAnalytical Solutions of Heat Transfer and Film Thickness in Thin Film Evaporation
typeJournal Paper
journal volume135
journal issue3
journal titleJournal of Heat Transfer
identifier doi10.1115/1.4007856
journal fristpage31501
journal lastpage31501
identifier eissn1528-8943
treeJournal of Heat Transfer:;2013:;volume( 135 ):;issue: 003
contenttypeFulltext


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