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    Measuring the Thermal Conductivity of Porous, Transparent SiO2 Films With Time Domain Thermoreflectance

    Source: Journal of Heat Transfer:;2011:;volume( 133 ):;issue: 006::page 61601
    Author:
    Patrick E. Hopkins
    ,
    Bryan Kaehr
    ,
    Leslie M. Phinney
    ,
    Darren Dunphy
    ,
    C. Jeffrey Brinker
    ,
    Fred Garcia
    ,
    Timothy P. Koehler
    ,
    Anne M. Grillet
    DOI: 10.1115/1.4003548
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Nanocomposites offer unique capabilities of controlling thermal transport through the manipulation of various structural aspects of the material. However, measurements of the thermal properties of these composites are often difficult, especially porous nanomaterials. Optical measurements of these properties, although ideal due to the noncontact nature, are challenging due to the large surface variability of nanoporous structures. In this work, we use a vector-based thermal algorithm to solve for the temperature change and heat transfer in which a thin film subjected to a modulated heat source is sandwiched between two thermally conductive pathways. We validate our solution with time domain thermoreflectance measurements on glass slides and extend the thermal conductivity measurements to SiO2-based nanostructured films.
    keyword(s): Heat , Heat transfer , Glass , Thermal conductivity , Geometry , Thermoreflectance , Temperature , Algorithms , Measurement , Transparency , Probes , Thin films AND Composite materials ,
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      Measuring the Thermal Conductivity of Porous, Transparent SiO2 Films With Time Domain Thermoreflectance

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/146675
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    • Journal of Heat Transfer

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    contributor authorPatrick E. Hopkins
    contributor authorBryan Kaehr
    contributor authorLeslie M. Phinney
    contributor authorDarren Dunphy
    contributor authorC. Jeffrey Brinker
    contributor authorFred Garcia
    contributor authorTimothy P. Koehler
    contributor authorAnne M. Grillet
    date accessioned2017-05-09T00:45:01Z
    date available2017-05-09T00:45:01Z
    date copyrightJune, 2011
    date issued2011
    identifier issn0022-1481
    identifier otherJHTRAO-27915#061601_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/146675
    description abstractNanocomposites offer unique capabilities of controlling thermal transport through the manipulation of various structural aspects of the material. However, measurements of the thermal properties of these composites are often difficult, especially porous nanomaterials. Optical measurements of these properties, although ideal due to the noncontact nature, are challenging due to the large surface variability of nanoporous structures. In this work, we use a vector-based thermal algorithm to solve for the temperature change and heat transfer in which a thin film subjected to a modulated heat source is sandwiched between two thermally conductive pathways. We validate our solution with time domain thermoreflectance measurements on glass slides and extend the thermal conductivity measurements to SiO2-based nanostructured films.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleMeasuring the Thermal Conductivity of Porous, Transparent SiO2 Films With Time Domain Thermoreflectance
    typeJournal Paper
    journal volume133
    journal issue6
    journal titleJournal of Heat Transfer
    identifier doi10.1115/1.4003548
    journal fristpage61601
    identifier eissn1528-8943
    keywordsHeat
    keywordsHeat transfer
    keywordsGlass
    keywordsThermal conductivity
    keywordsGeometry
    keywordsThermoreflectance
    keywordsTemperature
    keywordsAlgorithms
    keywordsMeasurement
    keywordsTransparency
    keywordsProbes
    keywordsThin films AND Composite materials
    treeJournal of Heat Transfer:;2011:;volume( 133 ):;issue: 006
    contenttypeFulltext
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