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contributor authorP. A. Manoharan
contributor authorD. Nedumaran
date accessioned2017-05-09T00:40:11Z
date available2017-05-09T00:40:11Z
date copyrightNovember, 2010
date issued2010
identifier issn1949-2944
identifier otherJNEMAA-28046#041003_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/144507
description abstractDesign and simulation of MEMS based capacitive sensor with doubly supported serpentine meander structure for millibar pressure applications proposed in this work is analyzed using INTELLISUITE ™ and NISA ™ softwares. In this model, microsensing membrane (MSM) is simulated using gold, silicon, and platinum materials of 1 μm and 2 μm thickness. This model has the incorporation to study the sensitivity and spring constant of the support structures for different boundary conditions. The model is validated in terms of virtual force method and finite element method. The design performance of the model is analyzed for the MSM’s support structure stability, maximum permissible displacement limit, sensitivity, pull-in, hysteresis, and dynamic behavior for different pressure loads. Design consideration is taken care to avoid deformation of MSM for the application of pressure load. The spring constant and the effect of fringing field capacitance is evaluated to optimize the design. The key factors of design information for the fabrication of millibar pressure sensor are analyzed.
publisherThe American Society of Mechanical Engineers (ASME)
titleModeling-Simulation and Analysis of MEMS Capacitive Millibar Pressure Sensor
typeJournal Paper
journal volume1
journal issue4
journal titleJournal of Nanotechnology in Engineering and Medicine
identifier doi10.1115/1.4002320
journal fristpage41003
identifier eissn1949-2952
keywordsElectric potential
keywordsSensors
keywordsCapacitance
keywordsSimulation
keywordsStress
keywordsPressure sensors
keywordsMicroelectromechanical systems
keywordsDesign
keywordsModeling
keywordsBoundary-value problems
keywordsDisplacement
keywordsElastic constants
keywordsMembranes
keywordsForce
keywordsPressure
keywordsThickness
keywordsStability
keywordsManufacturing
keywordsSilicon AND Finite element methods
treeJournal of Nanotechnology in Engineering and Medicine:;2010:;volume( 001 ):;issue: 004
contenttypeFulltext


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