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    Tip Based Nanomanipulation Through Successive Directional Push

    Source: Journal of Manufacturing Science and Engineering:;2010:;volume( 132 ):;issue: 003::page 30909
    Author:
    Wei Zhao
    ,
    Rong Wang
    ,
    Kangmin Xu
    ,
    Xiaoping Qian
    DOI: 10.1115/1.4001676
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Nanomanipulation refers to the process of transporting nanoscale components. It has found applications in nanodevice prototyping and biomolecular and cellular investigation. In this paper, we present an atomic force microscope (AFM) based approach for automated manipulation of nanoparticles to form designed patterns. The automated manipulation is based on a novel method, successive directional push. This method keeps pushing along a fixed forward direction until the particle reaches the baseline of the target position, and it then repeats the pushing process along the baseline direction. This process is iterated until the particle reaches its target position. By examining the topography of several local parallel scan lines, this method can determine the lateral coordinate of the particle. The novelty of this method lies in the fact that further pushing along the same pushing direction can be conducted without precise information about the forward position. The successive directional push method has been successfully implemented into an AFM system. We demonstrate that complex designed patterns including over 100 latex particles of 50 nm diameter can be fabricated with this method.
    keyword(s): Atomic force microscopy , Particulate matter AND Algorithms ,
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      Tip Based Nanomanipulation Through Successive Directional Push

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    http://yetl.yabesh.ir/yetl1/handle/yetl/144049
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    contributor authorWei Zhao
    contributor authorRong Wang
    contributor authorKangmin Xu
    contributor authorXiaoping Qian
    date accessioned2017-05-09T00:39:20Z
    date available2017-05-09T00:39:20Z
    date copyrightJune, 2010
    date issued2010
    identifier issn1087-1357
    identifier otherJMSEFK-28371#030909_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/144049
    description abstractNanomanipulation refers to the process of transporting nanoscale components. It has found applications in nanodevice prototyping and biomolecular and cellular investigation. In this paper, we present an atomic force microscope (AFM) based approach for automated manipulation of nanoparticles to form designed patterns. The automated manipulation is based on a novel method, successive directional push. This method keeps pushing along a fixed forward direction until the particle reaches the baseline of the target position, and it then repeats the pushing process along the baseline direction. This process is iterated until the particle reaches its target position. By examining the topography of several local parallel scan lines, this method can determine the lateral coordinate of the particle. The novelty of this method lies in the fact that further pushing along the same pushing direction can be conducted without precise information about the forward position. The successive directional push method has been successfully implemented into an AFM system. We demonstrate that complex designed patterns including over 100 latex particles of 50 nm diameter can be fabricated with this method.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleTip Based Nanomanipulation Through Successive Directional Push
    typeJournal Paper
    journal volume132
    journal issue3
    journal titleJournal of Manufacturing Science and Engineering
    identifier doi10.1115/1.4001676
    journal fristpage30909
    identifier eissn1528-8935
    keywordsAtomic force microscopy
    keywordsParticulate matter AND Algorithms
    treeJournal of Manufacturing Science and Engineering:;2010:;volume( 132 ):;issue: 003
    contenttypeFulltext
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