Development of Plasma Nanomanufacturing WorkcellSource: Journal of Manufacturing Science and Engineering:;2010:;volume( 132 ):;issue: 003::page 31003Author:King Wai Chiu Lai
,
Jeffri J. Narendra
,
Ning Xi
,
Jiangbo Zhang
,
Timothy A. Grotjohn
,
Jes Asmussen
DOI: 10.1115/1.4001719Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Plasma processing is an important technology, which provides a capability to modify the material surface through etching, deposition, activation, functionalization, polymerization, etc. In the current plasma process, the reactive area of the sample is relatively large and thus a mask is needed for selectively treating the sample surface. As a result, the whole fabrication process has become more complicated. In this paper, a plasma integrated nanomanufacturing workcell, which consists of a microplasma source and an integrated atomic force microscopy (AFM) probe tip, has been developed to improve the current plasma apparatus design. The miniature microwave plasma discharge applicator is capable of creating a miniature plasma stream with a diameter ranging from 2 mm down to micrometers. Hence, with the new plasma apparatus it has become possible to locally treat a small area of the sample surface and simplify the fabrication process as the photomask is not required. Additionally, the AFM active probe can be precisely positioned on a desired surface to inspect and manipulate nanoobjects. Here, we report the design and implementation of this new system. Experimental results demonstrate the effectiveness of the system and show that the microplasma can be used in various applications including localized etching of silicon and diamond and localized patterning of photoresist.
keyword(s): Atomic force microscopy , Plasmas (Ionized gases) , Etching , Probes , Photoresists , Silicon , Design AND Diamonds ,
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| contributor author | King Wai Chiu Lai | |
| contributor author | Jeffri J. Narendra | |
| contributor author | Ning Xi | |
| contributor author | Jiangbo Zhang | |
| contributor author | Timothy A. Grotjohn | |
| contributor author | Jes Asmussen | |
| date accessioned | 2017-05-09T00:39:19Z | |
| date available | 2017-05-09T00:39:19Z | |
| date copyright | June, 2010 | |
| date issued | 2010 | |
| identifier issn | 1087-1357 | |
| identifier other | JMSEFK-28371#031003_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/144039 | |
| description abstract | Plasma processing is an important technology, which provides a capability to modify the material surface through etching, deposition, activation, functionalization, polymerization, etc. In the current plasma process, the reactive area of the sample is relatively large and thus a mask is needed for selectively treating the sample surface. As a result, the whole fabrication process has become more complicated. In this paper, a plasma integrated nanomanufacturing workcell, which consists of a microplasma source and an integrated atomic force microscopy (AFM) probe tip, has been developed to improve the current plasma apparatus design. The miniature microwave plasma discharge applicator is capable of creating a miniature plasma stream with a diameter ranging from 2 mm down to micrometers. Hence, with the new plasma apparatus it has become possible to locally treat a small area of the sample surface and simplify the fabrication process as the photomask is not required. Additionally, the AFM active probe can be precisely positioned on a desired surface to inspect and manipulate nanoobjects. Here, we report the design and implementation of this new system. Experimental results demonstrate the effectiveness of the system and show that the microplasma can be used in various applications including localized etching of silicon and diamond and localized patterning of photoresist. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Development of Plasma Nanomanufacturing Workcell | |
| type | Journal Paper | |
| journal volume | 132 | |
| journal issue | 3 | |
| journal title | Journal of Manufacturing Science and Engineering | |
| identifier doi | 10.1115/1.4001719 | |
| journal fristpage | 31003 | |
| identifier eissn | 1528-8935 | |
| keywords | Atomic force microscopy | |
| keywords | Plasmas (Ionized gases) | |
| keywords | Etching | |
| keywords | Probes | |
| keywords | Photoresists | |
| keywords | Silicon | |
| keywords | Design AND Diamonds | |
| tree | Journal of Manufacturing Science and Engineering:;2010:;volume( 132 ):;issue: 003 | |
| contenttype | Fulltext |