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    Development of Plasma Nanomanufacturing Workcell

    Source: Journal of Manufacturing Science and Engineering:;2010:;volume( 132 ):;issue: 003::page 31003
    Author:
    King Wai Chiu Lai
    ,
    Jeffri J. Narendra
    ,
    Ning Xi
    ,
    Jiangbo Zhang
    ,
    Timothy A. Grotjohn
    ,
    Jes Asmussen
    DOI: 10.1115/1.4001719
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Plasma processing is an important technology, which provides a capability to modify the material surface through etching, deposition, activation, functionalization, polymerization, etc. In the current plasma process, the reactive area of the sample is relatively large and thus a mask is needed for selectively treating the sample surface. As a result, the whole fabrication process has become more complicated. In this paper, a plasma integrated nanomanufacturing workcell, which consists of a microplasma source and an integrated atomic force microscopy (AFM) probe tip, has been developed to improve the current plasma apparatus design. The miniature microwave plasma discharge applicator is capable of creating a miniature plasma stream with a diameter ranging from 2 mm down to micrometers. Hence, with the new plasma apparatus it has become possible to locally treat a small area of the sample surface and simplify the fabrication process as the photomask is not required. Additionally, the AFM active probe can be precisely positioned on a desired surface to inspect and manipulate nanoobjects. Here, we report the design and implementation of this new system. Experimental results demonstrate the effectiveness of the system and show that the microplasma can be used in various applications including localized etching of silicon and diamond and localized patterning of photoresist.
    keyword(s): Atomic force microscopy , Plasmas (Ionized gases) , Etching , Probes , Photoresists , Silicon , Design AND Diamonds ,
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      Development of Plasma Nanomanufacturing Workcell

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    contributor authorKing Wai Chiu Lai
    contributor authorJeffri J. Narendra
    contributor authorNing Xi
    contributor authorJiangbo Zhang
    contributor authorTimothy A. Grotjohn
    contributor authorJes Asmussen
    date accessioned2017-05-09T00:39:19Z
    date available2017-05-09T00:39:19Z
    date copyrightJune, 2010
    date issued2010
    identifier issn1087-1357
    identifier otherJMSEFK-28371#031003_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/144039
    description abstractPlasma processing is an important technology, which provides a capability to modify the material surface through etching, deposition, activation, functionalization, polymerization, etc. In the current plasma process, the reactive area of the sample is relatively large and thus a mask is needed for selectively treating the sample surface. As a result, the whole fabrication process has become more complicated. In this paper, a plasma integrated nanomanufacturing workcell, which consists of a microplasma source and an integrated atomic force microscopy (AFM) probe tip, has been developed to improve the current plasma apparatus design. The miniature microwave plasma discharge applicator is capable of creating a miniature plasma stream with a diameter ranging from 2 mm down to micrometers. Hence, with the new plasma apparatus it has become possible to locally treat a small area of the sample surface and simplify the fabrication process as the photomask is not required. Additionally, the AFM active probe can be precisely positioned on a desired surface to inspect and manipulate nanoobjects. Here, we report the design and implementation of this new system. Experimental results demonstrate the effectiveness of the system and show that the microplasma can be used in various applications including localized etching of silicon and diamond and localized patterning of photoresist.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleDevelopment of Plasma Nanomanufacturing Workcell
    typeJournal Paper
    journal volume132
    journal issue3
    journal titleJournal of Manufacturing Science and Engineering
    identifier doi10.1115/1.4001719
    journal fristpage31003
    identifier eissn1528-8935
    keywordsAtomic force microscopy
    keywordsPlasmas (Ionized gases)
    keywordsEtching
    keywordsProbes
    keywordsPhotoresists
    keywordsSilicon
    keywordsDesign AND Diamonds
    treeJournal of Manufacturing Science and Engineering:;2010:;volume( 132 ):;issue: 003
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
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