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contributor authorQiao Sun
contributor authorRobert A. Wolkow
contributor authorMark Salomons
date accessioned2017-05-09T00:35:56Z
date available2017-05-09T00:35:56Z
date copyrightDecember, 2009
date issued2009
identifier issn1048-9002
identifier otherJVACEK-28904#061010_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/142232
description abstractThe extreme sensitivity of a scanning probe microscope demands an exceptional noise cancellation device that could effectively cut off a wide range of vibration noise. Existing commercial devices, although excellent in canceling high frequency noise, commonly leave low frequency vibration unattenuated. We design an add-on active stage that can function together with a standalone existing active stage. The objective is to provide a higher level of noise cancellation by lowering the overall system cut-off frequency. This study is concerned with the theoretical aspects of the coupling characteristics involved in stacking independently designed stages together to form a two-stage isolator. Whether an add-on stage would pose a stability threat to the existing stage needs to be addressed. In addition, we explore the use of coupling effects to optimize the performance of the overall system.
publisherThe American Society of Mechanical Engineers (ASME)
titleLow Frequency Vibration Isolation Through an Active-on-Active Approach: Coupling Effects
typeJournal Paper
journal volume131
journal issue6
journal titleJournal of Vibration and Acoustics
identifier doi10.1115/1.4000477
journal fristpage61010
identifier eissn1528-8927
treeJournal of Vibration and Acoustics:;2009:;volume( 131 ):;issue: 006
contenttypeFulltext


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