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    A Submicron Multiaxis Positioning Stage for Micro- and Nanoscale Manufacturing Processes

    Source: Journal of Manufacturing Science and Engineering:;2008:;volume( 130 ):;issue: 003::page 31112
    Author:
    Ashwin Balasubramanian
    ,
    Martin B. Jun
    ,
    Richard E. DeVor
    ,
    Shiv G. Kapoor
    DOI: 10.1115/1.2917315
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: A piezoelectrically driven, submicron XY-positioning stage with multiprocess capability is developed and then integrated into two micro∕nanoscale manufacturing processes to improve their performance. The design is based on the HexFlex™ mechanism but is modified to improve structural robustness using a combination of factorial design, linear programming, and finite element analysis. Performance analysis reveals travel ranges of 16μm (X-axis) and 8μm (Y-axis), positioning accuracies of 87nm (X-axis) and 92nm (Y-axis), and overall stiffnesses of 32N∕μm (X-axis) and 36N∕μm (Y-axis). A comparison of microfluidic channels manufactured with a micromachine tool (mMT) alone and with the stage stacked on the mMT shows an improvement in feature accuracy from 870nmto170nm. The stage is integrated with an electrochemical deposition setup. Nanowire structures with sharp angles are fabricated. The diameter of these nanowires shows an improvement in uniformity by decreasing the standard deviation of diameter variation from 2.088μmto0.009μm.
    keyword(s): Motion , Manufacturing , Wire , Microfluidics , Actuators , Design , Channels (Hydraulic engineering) , Nanoscale phenomena , Nanowires , Piezoelectric actuators , Stiffness , Travel , Machining , Finite element analysis , Microscale devices , Errors , Force , Cutting , Displacement , Copper , Mechanisms AND Robustness ,
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      A Submicron Multiaxis Positioning Stage for Micro- and Nanoscale Manufacturing Processes

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/138728
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    • Journal of Manufacturing Science and Engineering

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    contributor authorAshwin Balasubramanian
    contributor authorMartin B. Jun
    contributor authorRichard E. DeVor
    contributor authorShiv G. Kapoor
    date accessioned2017-05-09T00:29:26Z
    date available2017-05-09T00:29:26Z
    date copyrightJune, 2008
    date issued2008
    identifier issn1087-1357
    identifier otherJMSEFK-28028#031112_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/138728
    description abstractA piezoelectrically driven, submicron XY-positioning stage with multiprocess capability is developed and then integrated into two micro∕nanoscale manufacturing processes to improve their performance. The design is based on the HexFlex™ mechanism but is modified to improve structural robustness using a combination of factorial design, linear programming, and finite element analysis. Performance analysis reveals travel ranges of 16μm (X-axis) and 8μm (Y-axis), positioning accuracies of 87nm (X-axis) and 92nm (Y-axis), and overall stiffnesses of 32N∕μm (X-axis) and 36N∕μm (Y-axis). A comparison of microfluidic channels manufactured with a micromachine tool (mMT) alone and with the stage stacked on the mMT shows an improvement in feature accuracy from 870nmto170nm. The stage is integrated with an electrochemical deposition setup. Nanowire structures with sharp angles are fabricated. The diameter of these nanowires shows an improvement in uniformity by decreasing the standard deviation of diameter variation from 2.088μmto0.009μm.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleA Submicron Multiaxis Positioning Stage for Micro- and Nanoscale Manufacturing Processes
    typeJournal Paper
    journal volume130
    journal issue3
    journal titleJournal of Manufacturing Science and Engineering
    identifier doi10.1115/1.2917315
    journal fristpage31112
    identifier eissn1528-8935
    keywordsMotion
    keywordsManufacturing
    keywordsWire
    keywordsMicrofluidics
    keywordsActuators
    keywordsDesign
    keywordsChannels (Hydraulic engineering)
    keywordsNanoscale phenomena
    keywordsNanowires
    keywordsPiezoelectric actuators
    keywordsStiffness
    keywordsTravel
    keywordsMachining
    keywordsFinite element analysis
    keywordsMicroscale devices
    keywordsErrors
    keywordsForce
    keywordsCutting
    keywordsDisplacement
    keywordsCopper
    keywordsMechanisms AND Robustness
    treeJournal of Manufacturing Science and Engineering:;2008:;volume( 130 ):;issue: 003
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
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