| contributor author | R. A. Enzenroth | |
| contributor author | K. L. Barth | |
| contributor author | W. S. Sampath | |
| contributor author | V. Manivannan | |
| date accessioned | 2017-05-09T00:25:42Z | |
| date available | 2017-05-09T00:25:42Z | |
| date copyright | August, 2007 | |
| date issued | 2007 | |
| identifier issn | 0199-6231 | |
| identifier other | JSEEDO-28405#327_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/136795 | |
| description abstract | In-line manufactured CdTe thin film photovoltaic devices were evaluated for their performance with respect to power conversion efficiency and reliability (stability). A National Renewable Energy Laboratory (NREL) certified power conversion efficiency (η) of 12.44% was measured for one CdTe device. A mean efficiency of 11.4% for 53 devices is shown. Results of reliability studies give a conservative estimate of −1% relative degradation per year in efficiency over a 20‐year lifetime for these CdTe devices. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Performance of In-Line Manufactured CdTe Thin Film Photovoltaic Devices | |
| type | Journal Paper | |
| journal volume | 129 | |
| journal issue | 3 | |
| journal title | Journal of Solar Energy Engineering | |
| identifier doi | 10.1115/1.2742393 | |
| journal fristpage | 327 | |
| journal lastpage | 330 | |
| identifier eissn | 1528-8986 | |
| keywords | Stability | |
| keywords | Thin films | |
| keywords | Manufacturing | |
| keywords | Reliability | |
| keywords | Energy conversion | |
| keywords | Testing | |
| keywords | Stress | |
| keywords | Circuits AND Robustness | |
| tree | Journal of Solar Energy Engineering:;2007:;volume( 129 ):;issue: 003 | |
| contenttype | Fulltext | |
