Nonlocality Effect in Atomic Force Microscopy Measurement and Its Reduction by an Approaching MethodSource: Journal of Engineering Materials and Technology:;2005:;volume( 127 ):;issue: 004::page 444DOI: 10.1115/1.1925290Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: In AFM measurements of surface morphology, the locality is a traditional assumption, i.e., the load recorded by AFM is simply the function of the distance between the tip of AFM and the point on a sample right opposite the tip [, 2003, “ Advances in Atomic Force Microscopy,” Rev. Mod. Phys., 75, pp. 949–983]. This paper presents that nonlocality effect may play an important role in atomic force microscopic (AFM) measurement. The nonlocality of AFM measurement results from two different finite scales: the finite scale of the characteristic intermolecular interaction distance and the geometric size of AFM tip. With a coupled molecular-continuum method, we analyzed this nonlocality effect in detail. It is found that the nonlocality effect can be formulated by a few dimensionless parameters characterizing the ratio of the following scales: the characteristic intermolecular interaction distance between the AFM tip and the sample, the characteristic size of the tip and the characteristic nano-structure and∕or the nanoscale roughness on the surface of a sample. The present work also suggests a data processing algorithm—the approaching method, which can reduce the nonlocality effect in AFM measurement of surface morphology effectively.
keyword(s): Atoms , Measurement , Atomic force microscopy , Force AND Surface roughness ,
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contributor author | Ming Hu | |
contributor author | Haiying Wang | |
contributor author | Mengfen Xia | |
contributor author | Fujiu Ke | |
contributor author | Yilong Bai | |
date accessioned | 2017-05-09T00:16:16Z | |
date available | 2017-05-09T00:16:16Z | |
date copyright | October, 2005 | |
date issued | 2005 | |
identifier issn | 0094-4289 | |
identifier other | JEMTA8-27074#444_1.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/131860 | |
description abstract | In AFM measurements of surface morphology, the locality is a traditional assumption, i.e., the load recorded by AFM is simply the function of the distance between the tip of AFM and the point on a sample right opposite the tip [, 2003, “ Advances in Atomic Force Microscopy,” Rev. Mod. Phys., 75, pp. 949–983]. This paper presents that nonlocality effect may play an important role in atomic force microscopic (AFM) measurement. The nonlocality of AFM measurement results from two different finite scales: the finite scale of the characteristic intermolecular interaction distance and the geometric size of AFM tip. With a coupled molecular-continuum method, we analyzed this nonlocality effect in detail. It is found that the nonlocality effect can be formulated by a few dimensionless parameters characterizing the ratio of the following scales: the characteristic intermolecular interaction distance between the AFM tip and the sample, the characteristic size of the tip and the characteristic nano-structure and∕or the nanoscale roughness on the surface of a sample. The present work also suggests a data processing algorithm—the approaching method, which can reduce the nonlocality effect in AFM measurement of surface morphology effectively. | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | Nonlocality Effect in Atomic Force Microscopy Measurement and Its Reduction by an Approaching Method | |
type | Journal Paper | |
journal volume | 127 | |
journal issue | 4 | |
journal title | Journal of Engineering Materials and Technology | |
identifier doi | 10.1115/1.1925290 | |
journal fristpage | 444 | |
journal lastpage | 450 | |
identifier eissn | 1528-8889 | |
keywords | Atoms | |
keywords | Measurement | |
keywords | Atomic force microscopy | |
keywords | Force AND Surface roughness | |
tree | Journal of Engineering Materials and Technology:;2005:;volume( 127 ):;issue: 004 | |
contenttype | Fulltext |