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    Adhesion Forces for Sub-10 nm Flying-Height Magnetic Storage Head Disk Interfaces

    Source: Journal of Tribology:;2004:;volume( 126 ):;issue: 002::page 334
    Author:
    Sung-Chang Lee
    ,
    Andreas A. Polycarpou
    DOI: 10.1115/1.1645299
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: A quasi-dynamic adhesion model is used to calculate the intermolecular adhesion forces present in ultra low flying Head Disk Interfaces (HDI’s). The model is a continuum-based micromechanics model that accounts for realistic surfaces with roughness, molecularly thin lubricants, and is valid under both static and dynamic sliding conditions. Several different levels of surface roughness are investigated ranging from extremely smooth surfaces having a standard deviation of surface heights σ=2 Å to rougher interfaces with several nanometer roughness. It is found that when the flying-height is greater than 5 nm, there are no significant adhesive forces, whereas for flying-heights less than 5 nm, adhesion forces increase sharply, which can be catastrophic to the reliability of low flying HDI’s. In addition to roughness, the apparent area of contact between the flying recording slider and the magnetic disk is also found to significantly affect the magnitude of the adhesion forces. The adhesion model is validated by direct comparisons with adhesion “pull-off” force measurements performed using an Atomic Force Microscope with controlled probe tip areas and magnetic disks having different lubricant thickness.
    keyword(s): Lubricants , Surface roughness , Disks , Force , Atomic force microscopy AND Thickness ,
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      Adhesion Forces for Sub-10 nm Flying-Height Magnetic Storage Head Disk Interfaces

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    http://yetl.yabesh.ir/yetl1/handle/yetl/130902
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    contributor authorSung-Chang Lee
    contributor authorAndreas A. Polycarpou
    date accessioned2017-05-09T00:14:34Z
    date available2017-05-09T00:14:34Z
    date copyrightApril, 2004
    date issued2004
    identifier issn0742-4787
    identifier otherJOTRE9-28722#334_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/130902
    description abstractA quasi-dynamic adhesion model is used to calculate the intermolecular adhesion forces present in ultra low flying Head Disk Interfaces (HDI’s). The model is a continuum-based micromechanics model that accounts for realistic surfaces with roughness, molecularly thin lubricants, and is valid under both static and dynamic sliding conditions. Several different levels of surface roughness are investigated ranging from extremely smooth surfaces having a standard deviation of surface heights σ=2 Å to rougher interfaces with several nanometer roughness. It is found that when the flying-height is greater than 5 nm, there are no significant adhesive forces, whereas for flying-heights less than 5 nm, adhesion forces increase sharply, which can be catastrophic to the reliability of low flying HDI’s. In addition to roughness, the apparent area of contact between the flying recording slider and the magnetic disk is also found to significantly affect the magnitude of the adhesion forces. The adhesion model is validated by direct comparisons with adhesion “pull-off” force measurements performed using an Atomic Force Microscope with controlled probe tip areas and magnetic disks having different lubricant thickness.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleAdhesion Forces for Sub-10 nm Flying-Height Magnetic Storage Head Disk Interfaces
    typeJournal Paper
    journal volume126
    journal issue2
    journal titleJournal of Tribology
    identifier doi10.1115/1.1645299
    journal fristpage334
    journal lastpage341
    identifier eissn1528-8897
    keywordsLubricants
    keywordsSurface roughness
    keywordsDisks
    keywordsForce
    keywordsAtomic force microscopy AND Thickness
    treeJournal of Tribology:;2004:;volume( 126 ):;issue: 002
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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