contributor author | Zhenhua Xiong | |
contributor author | Zexiang Li | |
date accessioned | 2017-05-09T00:10:48Z | |
date available | 2017-05-09T00:10:48Z | |
date copyright | February, 2003 | |
date issued | 2003 | |
identifier issn | 1087-1357 | |
identifier other | JMSEFK-27657#100_1.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/128757 | |
description abstract | Workpiece localization has direct relations with many manufacturing automation applications. In order to gain accurate workpiece measurement by on-machine measurement system or coordinate measuring machines (CMM), the touch trigger probe is widely adopted. In spite of the high repeatability of the touch trigger probe, there are still error sources associated with the probe. In this paper, we will focus on probe radius compensation. We first show the sources of probe radius error. Then, several compensation methods in related papers are reviewed. After that, a new radius compensation method is proposed in this paper. Simulation and experimental results of probe radius compensation by different methods are given. It is shown that our proposed method has the best performance both in terms of compensation accuracy and computational time. The method is also implemented in a computer aided setup (CAS) system. | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | Probe Radius Compensation of Workpiece Localization | |
type | Journal Paper | |
journal volume | 125 | |
journal issue | 1 | |
journal title | Journal of Manufacturing Science and Engineering | |
identifier doi | 10.1115/1.1537260 | |
journal fristpage | 100 | |
journal lastpage | 104 | |
identifier eissn | 1528-8935 | |
keywords | Probes | |
keywords | Errors AND Machinery | |
tree | Journal of Manufacturing Science and Engineering:;2003:;volume( 125 ):;issue: 001 | |
contenttype | Fulltext | |