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    Control of Thin Film Growth in Chemical Vapor Deposition Manufacturing Systems: A Feasibility Study

    Source: Journal of Manufacturing Science and Engineering:;2002:;volume( 124 ):;issue: 003::page 715
    Author:
    Wilson K. S. Chiu
    ,
    Yogesh Jaluria
    ,
    Nick G. Glumac
    DOI: 10.1115/1.1465434
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: A study is carried out to design and optimize Chemical Vapor Deposition (CVD) systems for material fabrication. Design and optimization of the CVD process is necessary to satisfying strong global demand and ever increasing quality requirements for thin film production. Advantages of computer aided optimization include high design turnaround time, flexibility to explore a larger design space and the development and adaptation of automation techniques for design and optimization. A CVD reactor consisting of a vertical impinging jet at atmospheric pressure, for growing titanium nitride films, is studied for thin film deposition. Numerical modeling and simulation are used to determine the rate of deposition and film uniformity over a wide range of design variables and operating conditions. These results are used for system design and optimization. The optimization procedure employs an objective function characterizing film quality, productivity and operational costs based on reactor gas flow rate, susceptor temperature and precursor concentration. Parameter space mappings are used to determine the design space, while a minimization algorithm, such as the steepest descent method, is used to determine optimal operating conditions for the system. The main features of computer aided design and optimization, using these techniques, are discussed in detail.
    keyword(s): Thin films , Temperature , Chemical vapor deposition , Design , Optimization , Computer simulation , Manufacturing systems AND Flow (Dynamics) ,
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      Control of Thin Film Growth in Chemical Vapor Deposition Manufacturing Systems: A Feasibility Study

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    http://yetl.yabesh.ir/yetl1/handle/yetl/127085
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    contributor authorWilson K. S. Chiu
    contributor authorYogesh Jaluria
    contributor authorNick G. Glumac
    date accessioned2017-05-09T00:08:00Z
    date available2017-05-09T00:08:00Z
    date copyrightAugust, 2002
    date issued2002
    identifier issn1087-1357
    identifier otherJMSEFK-27600#715_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/127085
    description abstractA study is carried out to design and optimize Chemical Vapor Deposition (CVD) systems for material fabrication. Design and optimization of the CVD process is necessary to satisfying strong global demand and ever increasing quality requirements for thin film production. Advantages of computer aided optimization include high design turnaround time, flexibility to explore a larger design space and the development and adaptation of automation techniques for design and optimization. A CVD reactor consisting of a vertical impinging jet at atmospheric pressure, for growing titanium nitride films, is studied for thin film deposition. Numerical modeling and simulation are used to determine the rate of deposition and film uniformity over a wide range of design variables and operating conditions. These results are used for system design and optimization. The optimization procedure employs an objective function characterizing film quality, productivity and operational costs based on reactor gas flow rate, susceptor temperature and precursor concentration. Parameter space mappings are used to determine the design space, while a minimization algorithm, such as the steepest descent method, is used to determine optimal operating conditions for the system. The main features of computer aided design and optimization, using these techniques, are discussed in detail.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleControl of Thin Film Growth in Chemical Vapor Deposition Manufacturing Systems: A Feasibility Study
    typeJournal Paper
    journal volume124
    journal issue3
    journal titleJournal of Manufacturing Science and Engineering
    identifier doi10.1115/1.1465434
    journal fristpage715
    journal lastpage724
    identifier eissn1528-8935
    keywordsThin films
    keywordsTemperature
    keywordsChemical vapor deposition
    keywordsDesign
    keywordsOptimization
    keywordsComputer simulation
    keywordsManufacturing systems AND Flow (Dynamics)
    treeJournal of Manufacturing Science and Engineering:;2002:;volume( 124 ):;issue: 003
    contenttypeFulltext
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