| contributor author | Kevin B. Smith | |
| contributor author | Yuan F. Zheng | |
| date accessioned | 2017-05-09T00:02:51Z | |
| date available | 2017-05-09T00:02:51Z | |
| date copyright | August, 2000 | |
| date issued | 2000 | |
| identifier issn | 1087-1357 | |
| identifier other | JMSEFK-27415#582_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/123959 | |
| description abstract | Point Laser Triangulation (PLT) probes have significant advantages over traditional touch probes. These advantages include throughput and no contact force, which motivate use of PLT probes on Coordinate Measuring Machines (CMMs). This document addresses the problem of extrinsic calibration. We present a precise technique for calibrating a PLT probe to a CMM. This new method uses known information from a localized polyhedron and measurements taken on the polyhedron by the PLT probe to determine the calibration parameters. With increasing interest in applying PLT probes for point measurements in coordinate metrology, such a calibration method is needed. [S1087-1357(00)01703-2] | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Point Laser Triangulation Probe Calibration for Coordinate Metrology | |
| type | Journal Paper | |
| journal volume | 122 | |
| journal issue | 3 | |
| journal title | Journal of Manufacturing Science and Engineering | |
| identifier doi | 10.1115/1.1286256 | |
| journal fristpage | 582 | |
| journal lastpage | 586 | |
| identifier eissn | 1528-8935 | |
| keywords | Calibration AND Probes | |
| tree | Journal of Manufacturing Science and Engineering:;2000:;volume( 122 ):;issue: 003 | |
| contenttype | Fulltext | |