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    Creep Deformation and Failure: Effects of Randomness and Scatter

    Source: Journal of Engineering Materials and Technology:;2000:;volume( 122 ):;issue: 003::page 342
    Author:
    D. G. Harlow
    ,
    T. J. Delph
    DOI: 10.1115/1.482807
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: A notable feature of replicated creep and creep-rupture data is the considerable amount of statistical scatter present. The existence of this scatter leads to substantial uncertainties in the predictions of creep deformation and failure. In this paper, we review the experimental evidence in this regard. We then survey recent efforts to construct models of creep deformation and rupture that include one or more aspects of this randomness. [S0094-4289(00)01703-5]
    keyword(s): Creep , Electromagnetic scattering , Failure AND Rupture ,
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      Creep Deformation and Failure: Effects of Randomness and Scatter

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    contributor authorD. G. Harlow
    contributor authorT. J. Delph
    date accessioned2017-05-09T00:02:33Z
    date available2017-05-09T00:02:33Z
    date copyrightJuly, 2000
    date issued2000
    identifier issn0094-4289
    identifier otherJEMTA8-27009#342_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/123766
    description abstractA notable feature of replicated creep and creep-rupture data is the considerable amount of statistical scatter present. The existence of this scatter leads to substantial uncertainties in the predictions of creep deformation and failure. In this paper, we review the experimental evidence in this regard. We then survey recent efforts to construct models of creep deformation and rupture that include one or more aspects of this randomness. [S0094-4289(00)01703-5]
    publisherThe American Society of Mechanical Engineers (ASME)
    titleCreep Deformation and Failure: Effects of Randomness and Scatter
    typeJournal Paper
    journal volume122
    journal issue3
    journal titleJournal of Engineering Materials and Technology
    identifier doi10.1115/1.482807
    journal fristpage342
    journal lastpage347
    identifier eissn1528-8889
    keywordsCreep
    keywordsElectromagnetic scattering
    keywordsFailure AND Rupture
    treeJournal of Engineering Materials and Technology:;2000:;volume( 122 ):;issue: 003
    contenttypeFulltext
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