| contributor author | E. J. Harley | |
| contributor author | D. J. Bammann | |
| contributor author | M. P. Miller | |
| date accessioned | 2017-05-08T23:59:48Z | |
| date available | 2017-05-08T23:59:48Z | |
| date copyright | April, 1999 | |
| date issued | 1999 | |
| identifier issn | 0094-4289 | |
| identifier other | JEMTA8-26997#162_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/122247 | |
| description abstract | Most metals exhibit a deformation-induced uniaxial yield strength asymmetry. Interpreted within the context of macroscale viscoplastic models, it is conventional to describe this yield strength asymmetry with an isotropic hardening variable, κ, and a kinematic hardening variable, α . The focus of this work was to conduct a series of reverse yield experiments to directly measure the evolution of α and κ in 304L stainless steel (SS304L) over large ranges of temperatures and strain rates. We found that the material exhibited inelastic behavior immediately on changing the straining direction. We discussed the ramifications of this behavior on our goal to directly measure α and κ within the context of an isotropic/kinematic hardening model framework. We also explored the capability of the model to simulate the behavior of SS304L under different loading conditions across a wide range of temperatures and strain rates. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Experimental Study of Internal Variable Evolution in SS304L, at Multiple Rates and Temperatures | |
| type | Journal Paper | |
| journal volume | 121 | |
| journal issue | 2 | |
| journal title | Journal of Engineering Materials and Technology | |
| identifier doi | 10.1115/1.2812362 | |
| journal fristpage | 162 | |
| journal lastpage | 171 | |
| identifier eissn | 1528-8889 | |
| keywords | Temperature | |
| keywords | Hardening | |
| keywords | Yield strength | |
| keywords | Deformation | |
| keywords | Stainless steel AND Metals | |
| tree | Journal of Engineering Materials and Technology:;1999:;volume( 121 ):;issue: 002 | |
| contenttype | Fulltext | |