contributor author | Xiao Lin | |
contributor author | Gu Haicheng | |
date accessioned | 2017-05-08T23:56:46Z | |
date available | 2017-05-08T23:56:46Z | |
date copyright | April, 1998 | |
date issued | 1998 | |
identifier issn | 0094-4289 | |
identifier other | JEMTA8-26991#114_1.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/120526 | |
description abstract | Low cycle fatigue properties of zirconium and zircaloy-4 were investigated at RT and 400°C. The microscopic structure was determined using scanning electron microscopy and transmission electron microscopy techniques. On the basis of analyses of fatigue damage mechanism, it is believed that fatigue is an irreversible energy dissipation process. Thus, the plastic dissipation energy per cycle is selected as a fatigue damage variable. The accumulated plastic dissipation energy is calculated at the condition of considering cyclic hardening, saturation and softening characters of zirconium and zircaloy-4 during cycling. The testing results show that there present a power law between the plastic dissipation energy and fatigue lifetime. | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | Plastic Energy Dissipation Model for Lifetime Prediction of Zirconium and Zircaloy-4 Fatigued at RT and 400°C | |
type | Journal Paper | |
journal volume | 120 | |
journal issue | 2 | |
journal title | Journal of Engineering Materials and Technology | |
identifier doi | 10.1115/1.2806998 | |
journal fristpage | 114 | |
journal lastpage | 118 | |
identifier eissn | 1528-8889 | |
keywords | Energy dissipation | |
keywords | Zirconium | |
keywords | Fatigue | |
keywords | Hardening | |
keywords | Mechanisms | |
keywords | Scanning electron microscopy | |
keywords | Testing | |
keywords | Cycles | |
keywords | Fatigue analysis | |
keywords | Fatigue damage | |
keywords | Low cycle fatigue AND Transmission electron microscopy | |
tree | Journal of Engineering Materials and Technology:;1998:;volume( 120 ):;issue: 002 | |
contenttype | Fulltext | |