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contributor authorWei Deng
contributor authorS. A. Meguid
date accessioned2017-05-08T23:55:45Z
date available2017-05-08T23:55:45Z
date copyrightMarch, 1998
date issued1998
identifier issn0021-8936
identifier otherJAMCAV-26435#76_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/119977
description abstractThis paper is concerned with the electro-elastic analysis of a conducting rigid line inclusion at the interface of two bonded piezoelectric materials. By combining the analytic function theory and the Stroh formalism, we were able to obtain closed-form expressions for the field variables. Both the mechanical stresses and the electric displacement are shown to have at least one of the following behaviors: (i) traditional square root singularity; (ii) nonsquare root singularity; and (iii) oscillatory singularity, which depend upon the electro-elastic mismatch at the interface. By using the static equilibrium conditions, the rigid rotation vector of the inclusion is determined and the extended stress singularity factors (ESSF) are evaluated.
publisherThe American Society of Mechanical Engineers (ASME)
titleAnalysis of Conducting Rigid Inclusion at the Interface of Two Dissimilar Piezoelectric Materials
typeJournal Paper
journal volume65
journal issue1
journal titleJournal of Applied Mechanics
identifier doi10.1115/1.2789049
journal fristpage76
journal lastpage84
identifier eissn1528-9036
keywordsPiezoelectric materials
keywordsStress
keywordsEquilibrium (Physics)
keywordsDisplacement
keywordsStress singularity AND Rotation
treeJournal of Applied Mechanics:;1998:;volume( 065 ):;issue: 001
contenttypeFulltext


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