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    On the Constitutive Response of 63/37 Sn/Pb Eutectic Solder

    Source: Journal of Engineering Materials and Technology:;1996:;volume( 118 ):;issue: 001::page 1
    Author:
    A. F. Skipor
    ,
    S. V. Harren
    ,
    J. Botsis
    DOI: 10.1115/1.2805929
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The constitutive response of 63/37 Sn/Pb eutectic solder is studied under uniaxial tension. Stress-strain tests were performed under a wide range of applied strain rate, and creep tests were performed at several levels of applied load. Temperature dependence was ascertained by running the stress-strain and creep tests at various temperatures. With the goal of providing a constitutive description of the eutectic suitable for use in electronics packaging engineering finite element analyses, the material parameters of the phenomenological viscoplasticity model of Bodner and Partom were fit to these experiments as functions of temperature. The experiments described herein also yield important information concerning how many microstructural units must be present in a sample in order for repeatable, isotropic response to be obtained.
    keyword(s): Solders , Temperature , Stress , Creep , Electronic packaging , Finite element analysis , Functions , Tension AND Viscoplasticity ,
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      On the Constitutive Response of 63/37 Sn/Pb Eutectic Solder

    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/117070
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    contributor authorA. F. Skipor
    contributor authorS. V. Harren
    contributor authorJ. Botsis
    date accessioned2017-05-08T23:50:22Z
    date available2017-05-08T23:50:22Z
    date copyrightJanuary, 1996
    date issued1996
    identifier issn0094-4289
    identifier otherJEMTA8-26976#1_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/117070
    description abstractThe constitutive response of 63/37 Sn/Pb eutectic solder is studied under uniaxial tension. Stress-strain tests were performed under a wide range of applied strain rate, and creep tests were performed at several levels of applied load. Temperature dependence was ascertained by running the stress-strain and creep tests at various temperatures. With the goal of providing a constitutive description of the eutectic suitable for use in electronics packaging engineering finite element analyses, the material parameters of the phenomenological viscoplasticity model of Bodner and Partom were fit to these experiments as functions of temperature. The experiments described herein also yield important information concerning how many microstructural units must be present in a sample in order for repeatable, isotropic response to be obtained.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleOn the Constitutive Response of 63/37 Sn/Pb Eutectic Solder
    typeJournal Paper
    journal volume118
    journal issue1
    journal titleJournal of Engineering Materials and Technology
    identifier doi10.1115/1.2805929
    journal fristpage1
    journal lastpage11
    identifier eissn1528-8889
    keywordsSolders
    keywordsTemperature
    keywordsStress
    keywordsCreep
    keywordsElectronic packaging
    keywordsFinite element analysis
    keywordsFunctions
    keywordsTension AND Viscoplasticity
    treeJournal of Engineering Materials and Technology:;1996:;volume( 118 ):;issue: 001
    contenttypeFulltext
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