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contributor authorH. Yua
contributor authorS. C. Sanday
contributor authorD. J. Bacon
date accessioned2017-05-08T23:49:01Z
date available2017-05-08T23:49:01Z
date copyrightDecember, 1996
date issued1996
identifier issn0021-8936
identifier otherJAMCAV-26402#1042_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/116341
description abstractThe elastic force on a point defect within or near a surface layer is determined by the image method. There is no stable equilibrium position for the point defect in the surface layer, it is attracted either to the free surface or to the interface. When the point defect is in the substrate it is attracted to the interface when the surface layer is softer than the substrate and to an equilibrium position in the substrate when the surface layer is stiffer than the substrate, the equilibrium position being a function of the elastic constants and the layer thickness.
publisherThe American Society of Mechanical Engineers (ASME)
titleElastic Force on a Point Defect in or Near a Surface Layer
typeJournal Paper
journal volume63
journal issue4
journal titleJournal of Applied Mechanics
identifier doi10.1115/1.2787228
journal fristpage1042
journal lastpage1045
identifier eissn1528-9036
keywordsForce
keywordsEquilibrium (Physics)
keywordsElastic constants AND Thickness
treeJournal of Applied Mechanics:;1996:;volume( 063 ):;issue: 004
contenttypeFulltext


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