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    Pole Tip Recession Measurements on Thin Film Heads Using Optical Profilometry With Phase Correction and Atomic Force Microscopy

    Source: Journal of Tribology:;1993:;volume( 115 ):;issue: 003::page 382
    Author:
    Martin Smallen
    ,
    Jerry J. K. Lee
    DOI: 10.1115/1.2921647
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Pole tip recession in magnetic recording thin film heads contributes to spacing loss, which leads to a degradation in the readback signal. As manufacturers improve the performance of magnetic recording devices, this recession will become more significant to the performance of future products. Pole tip recession can be measured by several techniques, including stylus profilometry, optical profilometry, and atomic force microscopy. Stylus profilometry is generally not used since it has several problems in this application. In this study, good correlation was found between optical profilometry and atomic force microscopy measurements, provided that the optical measurements were corrected for phase shift. This is necessary because of the dissimilar materials in the thin film head. There are several methods for making this correction. One method is an analytical correction using known optical constants for the head materials. These constants should be well characterized as the measurements are quite sensitive to them. Overcoating the head with a thin film provides two other methods for getting around the material differences problem. However, these methods require an optimum film thickness. The film must be thick enough so that it behaves as a substrate, but not so thick that it fails to replicate the head. PACS numbers: 85.70.Kh, 06.90. + v, 42.72. + h, 78.65.Pi
    keyword(s): Thin films , Measurement , Atomic force microscopy , Poles (Building) , Magnetic recording , Film thickness , Signals , Phase shift AND Optical measurement ,
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      Pole Tip Recession Measurements on Thin Film Heads Using Optical Profilometry With Phase Correction and Atomic Force Microscopy

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    http://yetl.yabesh.ir/yetl1/handle/yetl/112656
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    contributor authorMartin Smallen
    contributor authorJerry J. K. Lee
    date accessioned2017-05-08T23:42:35Z
    date available2017-05-08T23:42:35Z
    date copyrightJuly, 1993
    date issued1993
    identifier issn0742-4787
    identifier otherJOTRE9-28504#382_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/112656
    description abstractPole tip recession in magnetic recording thin film heads contributes to spacing loss, which leads to a degradation in the readback signal. As manufacturers improve the performance of magnetic recording devices, this recession will become more significant to the performance of future products. Pole tip recession can be measured by several techniques, including stylus profilometry, optical profilometry, and atomic force microscopy. Stylus profilometry is generally not used since it has several problems in this application. In this study, good correlation was found between optical profilometry and atomic force microscopy measurements, provided that the optical measurements were corrected for phase shift. This is necessary because of the dissimilar materials in the thin film head. There are several methods for making this correction. One method is an analytical correction using known optical constants for the head materials. These constants should be well characterized as the measurements are quite sensitive to them. Overcoating the head with a thin film provides two other methods for getting around the material differences problem. However, these methods require an optimum film thickness. The film must be thick enough so that it behaves as a substrate, but not so thick that it fails to replicate the head. PACS numbers: 85.70.Kh, 06.90. + v, 42.72. + h, 78.65.Pi
    publisherThe American Society of Mechanical Engineers (ASME)
    titlePole Tip Recession Measurements on Thin Film Heads Using Optical Profilometry With Phase Correction and Atomic Force Microscopy
    typeJournal Paper
    journal volume115
    journal issue3
    journal titleJournal of Tribology
    identifier doi10.1115/1.2921647
    journal fristpage382
    journal lastpage386
    identifier eissn1528-8897
    keywordsThin films
    keywordsMeasurement
    keywordsAtomic force microscopy
    keywordsPoles (Building)
    keywordsMagnetic recording
    keywordsFilm thickness
    keywordsSignals
    keywordsPhase shift AND Optical measurement
    treeJournal of Tribology:;1993:;volume( 115 ):;issue: 003
    contenttypeFulltext
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