| contributor author | K. Tanaka | |
| contributor author | J. Matsuda | |
| contributor author | M. Hotta | |
| contributor author | K. Nishimori | |
| contributor author | K. Maeda | |
| date accessioned | 2017-05-08T23:39:44Z | |
| date available | 2017-05-08T23:39:44Z | |
| date copyright | April, 1992 | |
| date issued | 1992 | |
| identifier issn | 0742-4787 | |
| identifier other | JOTRE9-28495#274_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/110972 | |
| description abstract | A scanning electron microscope (SEM) with two secondary electron detectors is applied for the surface topography measurement of magnetic media. The principle of gradient determination of the SEM is based on a relation that the difference in the square signals between the two detectors is linearly proportional to surface gradient. The great advantage of the instrument is the capability of relocation for profiling. It is extremely useful for the examination of wear process at a fixed position in a sequential manner during wear testing. This is demonstrated by two sample data of measurement on thin film rigid disks. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | A Scanning Electron Microscope With Two Secondary Electron Detectors and Its Application to the Surface Topography Measurements of Magnetic Media | |
| type | Journal Paper | |
| journal volume | 114 | |
| journal issue | 2 | |
| journal title | Journal of Tribology | |
| identifier doi | 10.1115/1.2920884 | |
| journal fristpage | 274 | |
| journal lastpage | 279 | |
| identifier eissn | 1528-8897 | |
| keywords | Electrons | |
| keywords | Measurement | |
| keywords | Sensors | |
| keywords | Scanning electron microscopes | |
| keywords | Gradients | |
| keywords | Signals | |
| keywords | Wear testing | |
| keywords | Thin films | |
| keywords | Wear | |
| keywords | Instrumentation AND Disks | |
| tree | Journal of Tribology:;1992:;volume( 114 ):;issue: 002 | |
| contenttype | Fulltext | |